RECONSTRUCTING OPTICAL-PARAMETERS FROM HOLOGRAPHIC AMPLITUDE DATA

Reconstructing a set of quantitative parameters from measurements of scattered field intensity is addressed for materials with one-dimensional inhomogeneous profile. The scattered field is mixed coherently with a reference field to generate holographic intensity data. Radiation fields satisfying the homogeneous Helmholtz equation are considered. The measuring system is described in schematic form and a computer simulation for microwave illumination is presented in the context of quantitative non-destructive evaluation. A regularization technique is described for dealing with signal-to-noise ratios as low as 4 dB.