DISTANCE VOLTAGE CHARACTERISTICS IN SCANNING TUNNELING MICROSCOPY

[1] ELECTRON INTERFEROMETRY AT CRYSTAL-SURFACES [J]. PHYSICAL REVIEW LETTERS, 1985, 55 (09) : 987 - 990

[2] TUNNELING SPECTROSCOPY AND INVERSE PHOTOEMISSION - IMAGE AND FIELD STATES [J]. PHYSICAL REVIEW LETTERS, 1985, 55 (09) : 991 - 994

[3] 7X7 RECONSTRUCTION ON SI(111) RESOLVED IN REAL SPACE [J]. PHYSICAL REVIEW LETTERS, 1983, 50 (02) : 120 - 123

[4] TUNNELING THROUGH A CONTROLLABLE VACUUM GAP [J]. APPLIED PHYSICS LETTERS, 1982, 40 (02) : 178 - 180

[5] BINNIG G, 1982, HELV PHYS ACTA, V55, P726

[6] BINNIG G, 1985, UNPUB PHYS REV LETT

[7] ENERGY-RESOLVED PHOTOFIELD EMISSION FROM THE W(100) SURFACE-STATE [J]. PHYSICAL REVIEW B, 1985, 32 (02): : 1380 - 1382

[8] GARCIA N, 1985, B AM PHYS SOC, V30, P251

[9] GARCIA R, 1985, UNPUB

[10] ZUR BERECHNUNG DES TUNNELSTROMS DURCH EINE TRAPEZFORMIGE POTENTIALSTUFE [J]. SOLID-STATE ELECTRONICS, 1966, 9 (10) : 949 - &

[1] ELECTRON INTERFEROMETRY AT CRYSTAL-SURFACES [J]. PHYSICAL REVIEW LETTERS, 1985, 55 (09) : 987 - 990

[2] TUNNELING SPECTROSCOPY AND INVERSE PHOTOEMISSION - IMAGE AND FIELD STATES [J]. PHYSICAL REVIEW LETTERS, 1985, 55 (09) : 991 - 994

[3] 7X7 RECONSTRUCTION ON SI(111) RESOLVED IN REAL SPACE [J]. PHYSICAL REVIEW LETTERS, 1983, 50 (02) : 120 - 123

[4] TUNNELING THROUGH A CONTROLLABLE VACUUM GAP [J]. APPLIED PHYSICS LETTERS, 1982, 40 (02) : 178 - 180

[5] BINNIG G, 1982, HELV PHYS ACTA, V55, P726

[6] BINNIG G, 1985, UNPUB PHYS REV LETT

[7] ENERGY-RESOLVED PHOTOFIELD EMISSION FROM THE W(100) SURFACE-STATE [J]. PHYSICAL REVIEW B, 1985, 32 (02): : 1380 - 1382

[8] GARCIA N, 1985, B AM PHYS SOC, V30, P251

[9] GARCIA R, 1985, UNPUB

[10] ZUR BERECHNUNG DES TUNNELSTROMS DURCH EINE TRAPEZFORMIGE POTENTIALSTUFE [J]. SOLID-STATE ELECTRONICS, 1966, 9 (10) : 949 - &