PRELIMINARY STUDY OF PURE METAL-SURFACES USING AUGER-ELECTRON SPECTROSCOPY (AES), X-RAY PHOTOELECTRON-SPECTROSCOPY (XPS) AND SECONDARY ION MASS-SPECTROSCOPY (SIMS)

被引：11

作者：

GETTINGS, M ^{[1
]}

COAD, JP ^{[1
]}

机构：

[1] ATOM ENERGY RES ESTAB, MAT DEV DIV, HARWELL, ENGLAND

来源：

SURFACE SCIENCE | 1975年 / 53卷 / DEC期

关键词：

D O I：

10.1016/0039-6028(75)90160-0

中图分类号：

O64 [物理化学（理论化学）、化学物理学];

学科分类号：

070304 ; 081704 ;

摘要：

引用

页码：636 / 648

页数：13

共 21 条

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ANDERSEN, CA ;

HINTHORNE, JR .

ANALYTICAL CHEMISTRY, 1973, 45 (08) :1421-1438

[2] SURFACE INVESTIGATION OF SOLIDS BY STATICAL METHOD OF SECONDARY ION MASS SPECTROSCOPY (SIMS) [J].

BENNINGHOVEN, A .

SURFACE SCIENCE, 1973, 35 (01) :427-457

[3] UNTERSUCHUNGEN ZUR EMISSION POSITIVER SEKUNDARIONEN AUS FESTEN TARGETS . DIE BRAUCHBARKEIT DER IONENBESCHUSS-IONENQUELLE IN DER MASSENSPEKTROSKOPIE [J].

BESKE, HE .

ZEITSCHRIFT FUR NATURFORSCHUNG PART A-ASTROPHYSIK PHYSIK UND PHYSIKALISCHE CHEMIE, 1967, A 22 (04) :459-+

[4] EXPERIMENTAL EVALUATION OF A SIMPLE MODEL FOR QUANTITATIVE-ANALYSIS IN X-RAY PHOTOELECTRON-SPECTROSCOPY [J].

CARTER, WJ ;

SCHWEITZER, GK ;

CARLSON, TA .

JOURNAL OF ELECTRON SPECTROSCOPY AND RELATED PHENOMENA, 1974, 5 (NOV-D) :827-835

[5] QUANTITATIVE-ANALYSIS OF BINARY-ALLOYS BY XPS [J].

EBEL, MF .

JOURNAL OF ELECTRON SPECTROSCOPY AND RELATED PHENOMENA, 1974, 5 (NOV-D) :837-846

[6]

JORGENSEN CK, 1972, T FARADAY DISCUSSION, P269

[7]

JORGENSEN CK, 1971, MODERN ASPECTS LIGAN, pCH38

[8]

JOSHI A, 1973, J TEST EVAL, V1, P202, DOI 10.1520/JTE10004J

[9]

Nefedov V. I., 1973, Journal of Electron Spectroscopy and Related Phenomena, V2, P383, DOI 10.1016/0368-2048(73)80055-6

[10]

NORDLING C, 1972, ANGEW CHEM, V84, P144

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