The application of on-line standard addition method in microwave plasma torch atomic emission spectrometry
被引:0
作者:
Ye, DM
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h-index: 0
机构:
JILIN UNIV,DEPT CHEM,CHANGCHUN 130023,PEOPLES R CHINAJILIN UNIV,DEPT CHEM,CHANGCHUN 130023,PEOPLES R CHINA
Ye, DM
[1
]
Zhang, HQ
论文数: 0引用数: 0
h-index: 0
机构:
JILIN UNIV,DEPT CHEM,CHANGCHUN 130023,PEOPLES R CHINAJILIN UNIV,DEPT CHEM,CHANGCHUN 130023,PEOPLES R CHINA
Zhang, HQ
[1
]
Yu, JL
论文数: 0引用数: 0
h-index: 0
机构:
JILIN UNIV,DEPT CHEM,CHANGCHUN 130023,PEOPLES R CHINAJILIN UNIV,DEPT CHEM,CHANGCHUN 130023,PEOPLES R CHINA
Yu, JL
[1
]
Jin, QH
论文数: 0引用数: 0
h-index: 0
机构:
JILIN UNIV,DEPT CHEM,CHANGCHUN 130023,PEOPLES R CHINAJILIN UNIV,DEPT CHEM,CHANGCHUN 130023,PEOPLES R CHINA
Jin, QH
[1
]
机构:
[1] JILIN UNIV,DEPT CHEM,CHANGCHUN 130023,PEOPLES R CHINA
来源:
CHEMICAL JOURNAL OF CHINESE UNIVERSITIES-CHINESE
|
1995年
/
16卷
/
12期
关键词:
on-line standard addition method;
microwave plasma torch;
atomic emission spectrometry;
D O I:
暂无
中图分类号:
O6 [化学];
学科分类号:
0703 ;
摘要:
In this paper, the probability of eliminating matrix interferences in MPT-AES by on-line standard addition method was studied, The dynamic linear range of Cu and Mg is 0.05 similar to 80 mu g/mL. The relative standard deviations of them are 3.02% (1.0 mu g/mL, n = 7), and 4.47% (1.0 mu g/mL, n = 7) respectively. The results indicated that this method can eliminate matrix interferences and is useful in real sample analysis, The operation of this system is simple.