SURFACE AND BULK CORE-LEVEL SHIFTS OF THE SI(111) SQUARE-ROOT-3 X SQUARE-ROOT-3-AG SURFACE - EVIDENCE FOR A CHARGED SQUARE-ROOT-3 X SQUARE-ROOT-3 LAYER

被引：85

作者：

KONO, S ^{[1
]}

HIGASHIYAMA, K ^{[1
]}

KINOSHITA, T ^{[1
]}

MIYAHARA, T ^{[1
]}

KATO, H ^{[1
]}

OHSAWA, H ^{[1
]}

ENTA, Y ^{[1
]}

MAEDA, F ^{[1
]}

YAEGASHI, Y ^{[1
]}

机构：

[1] NATL LAB HIGH ENERGY PHYS,PHOTON FACTORY,TSUKUBA,IBARAKI 305,JAPAN

来源：

PHYSICAL REVIEW LETTERS | 1987年 / 58卷 / 15期

关键词：

D O I：

10.1103/PhysRevLett.58.1555

中图分类号：

O4 [物理学];

学科分类号：

0702 ;

摘要：

引用

页码：1555 / 1558

页数：4

共 16 条

[1] PHOTOEMISSION FROM SURFACE-ATOM CORE LEVELS, SURFACE DENSITIES OF STATES, AND METAL-ATOM CLUSTERS - A UNIFIED PICTURE
CITRIN, PH
WERTHEIM, GK
[J]. PHYSICAL REVIEW B, 1983, 27 (06): : 3176 - 3200
[2] HANAWA T, COMMUNICATION
[3] HANAWA T, 1986, IN PRESS J VAC SCI T
[4] DETERMINATION OF THE FERMI-LEVEL PINNING POSITION AT SI(111) SURFACES
HIMPSEL, FJ
HOLLINGER, G
POLLAK, RA
[J]. PHYSICAL REVIEW B, 1983, 28 (12): : 7014 - 7018
[5] SEMICONDUCTOR SURFACE STRUCTURES
Kahn, A.
[J]. SURFACE SCIENCE REPORTS, 1983, 3 (4-5) : 193 - 300
[6] X-RAY PHOTOELECTRON DIFFRACTION STUDY OF THE ATOMIC GEOMETRY OF THE SI(111) SQUARE-ROOT3 X SQUARE-ROOT3-AG SURFACE
KONO, S
HIGASHIYAMA, K
SAGAWA, T
[J]. SURFACE SCIENCE, 1986, 165 (01) : 21 - 36
[7] PHYSICS AND ELECTRONICS OF THE NOBLE-METAL ELEMENTAL-SEMICONDUCTOR INTERFACE FORMATION - A STATUS-REPORT
LELAY, G
[J]. SURFACE SCIENCE, 1983, 132 (1-3) : 169 - 204
[8] CONCLUDING REMARKS - INTERNATIONAL-CONFERENCE ON THE FORMATION OF SEMICONDUCTOR INTERFACES
LINDAU, I
[J]. SURFACE SCIENCE, 1986, 168 (1-3) : 860 - 864
[9] PHOTOEMISSION-STUDY OF SI(111)-GE(5X5) SURFACES
MILLER, T
HSIEH, TC
CHIANG, TC
[J]. PHYSICAL REVIEW B, 1986, 33 (10): : 6983 - 6989
[10] A NEW CONSTANT DEVIATION MONOCHROMATOR FOR ANGLE RESOLVED PHOTOEMISSION SPECTROSCOPY
MIYAHARA, T
SUZUKI, S
HANYU, T
KATO, H
NAITO, K
FUKUTANI, H
NAGAKURA, I
SUGAWARA, H
NAKAI, S
ISHII, T
NODA, H
NAMIOKA, T
SASAKI, T
[J]. JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES & REVIEW PAPERS, 1985, 24 (03): : 293 - 298

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