THE DESIGN OF TSC ERROR C/D CIRCUITS FOR SEC/DED CODES

被引:7
作者
GAITANIS, N
机构
关键词
D O I
10.1109/12.2162
中图分类号
TP3 [计算技术、计算机技术];
学科分类号
0812 ;
摘要
引用
收藏
页码:258 / 265
页数:8
相关论文
共 9 条
[1]   DESIGN OF TOTALLY SELF-CHECKING CHECK CIRCUITS FOR M-OUT-OF-N CODES [J].
ANDERSON, DA ;
METZE, G .
IEEE TRANSACTIONS ON COMPUTERS, 1973, C 22 (03) :263-269
[2]  
ANDERSON DA, 1971, R527M U ILL COORD SC
[3]  
BOSSEN DC, 1970, 1970 P AFIPS FALL JO, V17, P63
[4]  
CARTER WC, 1968, P IFIP C, V2, P878
[5]  
ELIAS P, 1954, IEEE T INFORM THEORY, V4, P29
[6]   ERROR DETECTING AND ERROR CORRECTING CODES [J].
HAMMING, RW .
BELL SYSTEM TECHNICAL JOURNAL, 1950, 29 (02) :147-160
[7]   A CLASS OF OPTIMAL MINIMUM ODD-WEIGHT-COLUMN SEC-DED CODES [J].
HSIAO, MY .
IBM JOURNAL OF RESEARCH AND DEVELOPMENT, 1970, 14 (04) :395-&
[8]  
KHAKBAZ J, 1982, 14TH ANN INT S FAULT, P109
[9]  
PRADHAN DK, 1980, IEEE T COMPUT, V29, P471, DOI 10.1109/TC.1980.1675606