THIN, HIGHLY DOPED LAYERS OF EPITAXIAL SILICON DEPOSITED BY LIMITED REACTION PROCESSING

被引:35
作者
GRONET, CM [1 ]
STURM, JC [1 ]
WILLIAMS, KE [1 ]
GIBBONS, JF [1 ]
WILSON, SD [1 ]
机构
[1] CHARLES EVANS & ASSOCIATES,SAN MATEO,CA 94402
关键词
D O I
10.1063/1.96620
中图分类号
O59 [应用物理学];
学科分类号
摘要
引用
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页码:1012 / 1014
页数:3
相关论文
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APPLIED PHYSICS LETTERS, 1985, 47 (07) :721-723
[4]  
KUBIAK RA, 1985, SILICON MOL BEAM EPI, P169
[5]   MODELING OF CARRIER MOBILITY AGAINST CARRIER CONCENTRATION IN ARSENIC-DOPED, PHOSPHORUS-DOPED, AND BORON-DOPED SILICON [J].
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SOLMI, S .
IEEE TRANSACTIONS ON ELECTRON DEVICES, 1983, 30 (07) :764-769