THERMAL-WAVE AND ACOUSTIC-WAVE TECHNIQUES IN SCANNING ELECTRON-MICROSCOPY

被引：11

|

作者：

BALK, LJ

机构：

来源：

CANADIAN JOURNAL OF PHYSICS | 1986年 / 64卷 / 09期

关键词：

D O I：

10.1139/p86-216

中图分类号：

O4 [物理学];

学科分类号：

0702 ;

摘要：

引用

收藏

页码：1238 / 1246

页数：9

相关论文

共 50 条

[1] SCANNING ELECTRON-MICROSCOPY OF RESONATING SURFACE ACOUSTIC-WAVE DEVICES
HIESINGER, P
SCHMIDT, KH
IEEE TRANSACTIONS ON SONICS AND ULTRASONICS, 1979, 26 (02): : 161 - 161
[2] IMAGING OF DOPANT REGIONS IN SILICON WITH THERMAL-WAVE ELECTRON-MICROSCOPY
ROSENCWAIG, A
WHITE, RM
APPLIED PHYSICS LETTERS, 1981, 38 (03) : 165 - 167
[3] THERMAL-WAVE MICROSCOPY - A NEW APPLICATION OF THE SCANNING ELECTRON-MICROSCOPE
BRANDIS, EK
IEEE TRANSACTIONS ON SONICS AND ULTRASONICS, 1981, 28 (05): : 362 - 362
[4] THERMAL-WAVE MICROSCOPY
ROSENCWAIG, A
SOLID STATE TECHNOLOGY, 1982, 25 (03) : 91 - 97
[5] THERMAL-WAVE MICROSCOPY WITH ELECTRON-BEAMS
BRANDIS, E
ROSENCWAIG, A
APPLIED PHYSICS LETTERS, 1980, 37 (01) : 98 - 100
[6] THERMAL-WAVE MICROSCOPY
NGUYEN, T
ROSENCWAIG, A
CHEMTECH, 1986, 16 (10) : 634 - 640
[7] THERMAL-WAVE IMAGING IN A SCANNING ELECTRON-MICROSCOPE
ROSENCWAIG, A
ANNUAL REVIEW OF MATERIALS SCIENCE, 1985, 15 : 103 - 118
[8] THERMAL-WAVE IMAGING IN A SCANNING ELECTRON-MICROSCOPE
ROSENCWAIG, A
ACS SYMPOSIUM SERIES, 1986, 295 : 253 - 266
[9] THERMAL-WAVE IMAGING IN A SCANNING ELECTRON-MICROSCOPE
ROSENCWAIG, A
SCANNING ELECTRON MICROSCOPY, 1984, : 1611 - 1628
[10] THERMAL-WAVE IMAGING IN A SCANNING ELECTRON MICROSCOPE.
Rosencwaig, A.
Scanning Electron Microscopy, 1984, (pt 4) : 1611 - 1628

← 1 2 3 4 5 →