RAMAN-SCATTERING STUDY OF STRESS-INDUCED FERROELECTRICITY IN KTAO3

被引：38
|
作者：
UWE, H [1 ]
SAKUDO, T [1 ]
机构：
[1] ELECTROTECH LAB, TANASHI, TOKYO, JAPAN
来源：
PHYSICAL REVIEW B | 1977年 / 15卷 / 01期
关键词：
D O I：
10.1103/PhysRevB.15.337
中图分类号：
T [工业技术];
学科分类号：
08 ;
摘要：
引用
收藏
页码：337 / 345
页数：9
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