RAMAN-SCATTERING STUDY OF STRESS-INDUCED FERROELECTRICITY IN KTAO3

被引：38

作者：

UWE, H ^{[1
]}

SAKUDO, T ^{[1
]}

机构：

[1] ELECTROTECH LAB, TANASHI, TOKYO, JAPAN

来源：

PHYSICAL REVIEW B | 1977年 / 15卷 / 01期

关键词：

D O I：

10.1103/PhysRevB.15.337

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

引用

页码：337 / 345

页数：9

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