DIFFUSION PHENOMENA AT INTERFACE OF CDSE AND PTFE THIN-FILMS

[1] DIELECTRIC PROPERTIES OF THIN FILMS OF ALUMINIUM OXIDE AND SILICON OXIDE [J]. THIN SOLID FILMS, 1968, 2 (03) : 185 - &

[2] BARRER R, 1941, DIFFUSION IN THROUGH, P10

[3] BODAKOV YA, 1960, SOV PHYS-SOL STATE, V2, P49

[4] APPARATUS TO MEASURE THIN-FILM CAPACITORS IN FREQUENCY RANGE 0.0075-700HZ [J]. JOURNAL OF PHYSICS E-SCIENTIFIC INSTRUMENTS, 1973, 6 (07): : 619 - 622

[5] EVAPORATION OF POLYTETRAFLUOROETHYLENE BY ELECTRON-BOMBARDMENT OF BULK MATERIAL [J]. THIN SOLID FILMS, 1974, 24 (01) : 101 - 111

[6] DEWILDE W, TO BE PUBLISHED

[7] FINCK C, 1967, CR ACAD SCI B PHYS, V265, P1195

[8] HEARING R, 1967, P IEEE, V55, P692

[9] AN INVESTIGATION OF INSTABILITY AND CHARGE MOTION IN METAL-SILICON OXIDE-SILICON STRUCTURES [J]. IEEE TRANSACTIONS ON ELECTRON DEVICES, 1966, ED13 (02) : 222 - +

[10] PAUWELS H, TO BE PUBLISHED

[1] DIELECTRIC PROPERTIES OF THIN FILMS OF ALUMINIUM OXIDE AND SILICON OXIDE [J]. THIN SOLID FILMS, 1968, 2 (03) : 185 - &

[2] BARRER R, 1941, DIFFUSION IN THROUGH, P10

[3] BODAKOV YA, 1960, SOV PHYS-SOL STATE, V2, P49

[4] APPARATUS TO MEASURE THIN-FILM CAPACITORS IN FREQUENCY RANGE 0.0075-700HZ [J]. JOURNAL OF PHYSICS E-SCIENTIFIC INSTRUMENTS, 1973, 6 (07): : 619 - 622

[5] EVAPORATION OF POLYTETRAFLUOROETHYLENE BY ELECTRON-BOMBARDMENT OF BULK MATERIAL [J]. THIN SOLID FILMS, 1974, 24 (01) : 101 - 111

[6] DEWILDE W, TO BE PUBLISHED

[7] FINCK C, 1967, CR ACAD SCI B PHYS, V265, P1195

[8] HEARING R, 1967, P IEEE, V55, P692

[9] AN INVESTIGATION OF INSTABILITY AND CHARGE MOTION IN METAL-SILICON OXIDE-SILICON STRUCTURES [J]. IEEE TRANSACTIONS ON ELECTRON DEVICES, 1966, ED13 (02) : 222 - +

[10] PAUWELS H, TO BE PUBLISHED