RADIATIVE RECOMBINATION IN GERMANIUM AS AN INDICATOR OF RADIATION DAMAGE

被引：1
|
作者：
BRAUNSTEIN, R
机构：
来源：
SOLID-STATE ELECTRONICS | 1963年 / 6卷 / 04期
关键词：
D O I：
10.1016/0038-1101(63)90099-6
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
引用
收藏
页码：349 / 356
页数：8
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