MECHANISM OF FORMATION OF PRE-PASSIVE FILMS ON NICKEL - A CHRONOELLIPSOMETRIC STUDY

[1] Bockris J.OM., 1961, ELECTROCHIM ACTA, V4, P325, DOI [DOI 10.1016/0013-4686(61)80026-1, 10.1016/0013-4686(61)80026-1]

[2] AN ELLIPSOMETRIC DETERMINATION OF MECHANISM OF PASSIVITY OF NICKEL [J]. JOURNAL OF THE ELECTROCHEMICAL SOCIETY, 1966, 113 (11) : 1133 - &

[3] ANODIC FORMATION OF CALOMEL FILMS ON MERCURY ELECTRODES - ELLIPSOMETRIC-GALVANOSTATIC STUDY [J]. PROCEEDINGS OF THE ROYAL SOCIETY OF LONDON SERIES A-MATHEMATICAL AND PHYSICAL SCIENCES, 1964, 279 (1376) : 327 - +

[4] THE NICKEL OXIDE ELECTRODE .3. [J]. TRANSACTIONS OF THE FARADAY SOCIETY, 1956, 52 (09): : 1272 - 1281

[5] BRIGGS GWD, 1962, ELECTROCHIM ACTA, V7, P241, DOI DOI 10.1016/0013-4686(62)87001-7

[6] MILNER PC, 1967, ADVAN ELECTROCHEM EL, V5, P27

[7] Okamoto G., 1963, J ELECTROCHEM SOC, V110, P605, DOI [10.1149/1.2425838, DOI 10.1149/1.2425838]

[8] POURBAIX M, 1957, 7 P M CITCE LIND, P193

[9] RAO B, 1966, THESIS U PENNSYLVANI

[10] ELLIPSOMETRIC DETERMINATION OF FILM THICKNESS AND CONDUCTIVITY DURING PASSIVATION PROCESS ON NICKEL [J]. JOURNAL OF CHEMICAL PHYSICS, 1965, 42 (06) : 2246 - &

[1] Bockris J.OM., 1961, ELECTROCHIM ACTA, V4, P325, DOI [DOI 10.1016/0013-4686(61)80026-1, 10.1016/0013-4686(61)80026-1]

[2] AN ELLIPSOMETRIC DETERMINATION OF MECHANISM OF PASSIVITY OF NICKEL [J]. JOURNAL OF THE ELECTROCHEMICAL SOCIETY, 1966, 113 (11) : 1133 - &

[3] ANODIC FORMATION OF CALOMEL FILMS ON MERCURY ELECTRODES - ELLIPSOMETRIC-GALVANOSTATIC STUDY [J]. PROCEEDINGS OF THE ROYAL SOCIETY OF LONDON SERIES A-MATHEMATICAL AND PHYSICAL SCIENCES, 1964, 279 (1376) : 327 - +

[4] THE NICKEL OXIDE ELECTRODE .3. [J]. TRANSACTIONS OF THE FARADAY SOCIETY, 1956, 52 (09): : 1272 - 1281

[5] BRIGGS GWD, 1962, ELECTROCHIM ACTA, V7, P241, DOI DOI 10.1016/0013-4686(62)87001-7

[6] MILNER PC, 1967, ADVAN ELECTROCHEM EL, V5, P27

[7] Okamoto G., 1963, J ELECTROCHEM SOC, V110, P605, DOI [10.1149/1.2425838, DOI 10.1149/1.2425838]

[8] POURBAIX M, 1957, 7 P M CITCE LIND, P193

[9] RAO B, 1966, THESIS U PENNSYLVANI

[10] ELLIPSOMETRIC DETERMINATION OF FILM THICKNESS AND CONDUCTIVITY DURING PASSIVATION PROCESS ON NICKEL [J]. JOURNAL OF CHEMICAL PHYSICS, 1965, 42 (06) : 2246 - &