METHOD FOR MEASUREMENTS OF SENSITIVE LAYER THICKNESS OF SEMICONDUCTOR-DETECTORS

被引：0
作者：
ILYASOV, AZ [1 ]
MAZITOV, BS [1 ]
机构：
[1] ACAD SCI UZSSR,NUCL PHYS INST,ULUGBEK,UZSSR
来源：
PRIBORY I TEKHNIKA EKSPERIMENTA | 1974年 / 02期
关键词：
D O I：
暂无
中图分类号：
TH7 [仪器、仪表];
学科分类号：
0804 ; 080401 ; 081102 ;
摘要：
引用
收藏
页码：60 / 62
页数：3
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