SECONDARY-ELECTRON YIELD AND AUGER-ELECTRON SPECTROSCOPY MEASUREMENTS ON OXIDES, CARBIDE, AND NITRIDE OF NIOBIUM

被引：11

作者：

GARWIN, EL ^{[1
]}

HOYT, EW ^{[1
]}

KIRBY, RE ^{[1
]}

MOMOSE, T ^{[1
]}

机构：

[1] NATL LAB HIGH ENERGY PHYS,OHO,IBARAKI 30032,JAPAN

来源：

JOURNAL OF APPLIED PHYSICS | 1986年 / 59卷 / 09期

关键词：

D O I：

10.1063/1.337046

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

引用

页码：3245 / 3250

页数：6

共 50 条

[41] SPIN-POLARIZED AUGER-ELECTRON AND SECONDARY-ELECTRON EMISSION FROM THIN MAGNETIC-FILMS
LARMER, F
TABORELLI, M
ALLENSPACH, R
LANDOLT, M
HELVETICA PHYSICA ACTA, 1986, 59 (6-7): : 985 - 985
[42] EFFECT OF INSTRUMENTAL RESOLUTION ON QUANTIFICATION IN AUGER-ELECTRON SPECTROSCOPY MEASUREMENTS
MANY, A
GOLDSTEIN, Y
WEISZ, SZ
RESTO, O
VACUUM, 1990, 41 (7-9) : 1605 - 1607
[43] MONOLAYERS OF PLATINUM AND IRON ON TIO2(001) - CHARACTERIZATION BY AUGER-ELECTRON SPECTROSCOPY, SECONDARY-ELECTRON EMISSION AND WORK FUNCTION CHANGES
BRUGNIAU, D
PARKER, SD
RHEAD, GE
THIN SOLID FILMS, 1984, 121 (03) : 247 - 257
[44] AUGER-ELECTRON SPECTROSCOPY IN SCANNING ELECTRON-MICROSCOPE
WALDROP, JR
MARCUS, HL
JOURNAL OF TESTING AND EVALUATION, 1973, 1 (03) : 194 - 201
[45] BACKSCATTERED ELECTRON IMAGING WITH SCANNING AUGER-ELECTRON SPECTROSCOPY
THOMAS, JH
REVIEW OF SCIENTIFIC INSTRUMENTS, 1983, 54 (10) : 1289 - 1291
[46] ELECTRON-BEAM DAMAGE IN AUGER-ELECTRON SPECTROSCOPY
PANTANO, CG
MADEY, TE
APPLIED SURFACE SCIENCE, 1981, 7 (1-2) : 115 - 141
[47] ASPECTS OF QUANTITATIVE AUGER-ELECTRON SPECTROSCOPY
GOTO, K
SCANNING ELECTRON MICROSCOPY, 1984, : 103 - 109
[48] APPLICATIONS OF AUGER-ELECTRON SPECTROSCOPY IN MICROELECTRONICS
LINDFORS, PA
JONES, DL
KEE, RW
ABSTRACTS OF PAPERS OF THE AMERICAN CHEMICAL SOCIETY, 1984, 187 (APR): : 18 - INDE
[49] CHEMICAL INFORMATIONS IN AUGER-ELECTRON SPECTROSCOPY
CARRIERE, B
DEVILLE, JP
HUMBERT, P
JOURNAL DE MICROSCOPIE ET DE SPECTROSCOPIE ELECTRONIQUES, 1985, 10 (01): : 29 - 61
[50] CRYSTALLINE EFFECTS IN AUGER-ELECTRON SPECTROSCOPY
BISHOP, HE
CHORNIK, B
LEGRESSUS, C
LEMOEL, A
SURFACE AND INTERFACE ANALYSIS, 1984, 6 (03) : 116 - 128

← 1 2 3 4 5 →