SECONDARY-ELECTRON YIELD AND AUGER-ELECTRON SPECTROSCOPY MEASUREMENTS ON OXIDES, CARBIDE, AND NITRIDE OF NIOBIUM

被引：11

|

作者：

GARWIN, EL ^{[1
]}

HOYT, EW ^{[1
]}

KIRBY, RE ^{[1
]}

MOMOSE, T ^{[1
]}

机构：

[1] NATL LAB HIGH ENERGY PHYS,OHO,IBARAKI 30032,JAPAN

来源：

JOURNAL OF APPLIED PHYSICS | 1986年 / 59卷 / 09期

关键词：

D O I：

10.1063/1.337046

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

引用

收藏

页码：3245 / 3250

页数：6

相关论文

共 50 条

[21] PHASE SEPARATION IN SILICON OXIDES AS SEEN BY AUGER-ELECTRON SPECTROSCOPY
JOHANNESSEN, JS
SPICER, WE
STRAUSSER, YE
APPLIED PHYSICS LETTERS, 1975, 27 (08) : 452 - 454
[22] MEASUREMENTS OF THE MAGNITUDE OF CRYSTALLINE EFFECTS IN AUGER-ELECTRON SPECTROSCOPY
BISHOP, HE
SURFACE AND INTERFACE ANALYSIS, 1990, 15 (01) : 27 - 37
[23] STUDY OF OXIDATION OF TANTALUM NITRIDE BY ELLIPSOMETRY AND AUGER-ELECTRON SPECTROSCOPY
ADAMS, JR
KRAMER, DK
SURFACE SCIENCE, 1976, 56 (01) : 482 - 487
[24] QUANTITATIVE-ANALYSIS OF TITANIUM NITRIDE BY AUGER-ELECTRON SPECTROSCOPY
WATSON, DG
STICKLE, WF
DIEBOLD, AC
THIN SOLID FILMS, 1990, 193 (1-2) : 305 - 311
[25] LOW-YIELD SPUTTERING MEASUREMENTS ON CTR MATERIALS USING AUGER-ELECTRON SPECTROSCOPY
SMITH, JN
MEYER, CH
LAYTON, JK
TRANSACTIONS OF THE AMERICAN NUCLEAR SOCIETY, 1975, 22 (NOV16): : 29 - 30
[26] AUGER-ELECTRON SPECTROSCOPY AND ION SPUTTER PROFILES OF OXIDES ON ALUMINUM
SMITH, T
SURFACE SCIENCE, 1976, 55 (02) : 601 - 624
[27] APPLICATIONS OF AUGER-ELECTRON SPECTROSCOPY
不详
RESEARCH-DEVELOPMENT, 1973, 24 (07): : 36 - 38
[28] QUANTITATIVE AUGER-ELECTRON SPECTROSCOPY
CAILLER, M
GANACHAUD, JP
ROPTIN, D
ADVANCES IN ELECTRONINCS AND ELECTRON PHYSICS, 1983, 61 : 161 - 298
[29] DECONVOLUTION IN AUGER-ELECTRON SPECTROSCOPY
CHORNIK, B
BISHOP, HE
LEMOEL, A
LEGRESSUS, C
SCANNING ELECTRON MICROSCOPY, 1986, 1986 : 77 - 88
[30] LEED AND AUGER-ELECTRON SPECTROSCOPY
HAYAKAWA, K
JOURNAL OF JAPAN SOCIETY OF LUBRICATION ENGINEERS, 1974, 19 (03): : 237 - 242

← 1 2 3 4 5 →