NONDESTRUCTIVE DETERMINATION OF THICKNESS AND PERFECTION OF SILICA FILMS

被引:6
作者
MURRAY, LA
GOLDSMITH, N
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D O I
10.1149/1.2423809
中图分类号
O646 [电化学、电解、磁化学];
学科分类号
081704 ;
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页码:1297 / +
页数:1
相关论文
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[6]  
PLISKIN W, 1964, MAY TOR M SOC
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SIMON, I ;
MCMAHON, HO .
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