SIMULTANEOUS INVESTIGATION OF CRYSTAL-STRUCTURE AND ELECTRICAL PROPERTIES OF CRYSTALLIZED GERMANIUM FILMS BY UHV INSITU ELECTRON-MICROSCOPY

被引：13

作者：

BARNA, A ^{[1
]}

BARNA, PB ^{[1
]}

BODO, Z ^{[1
]}

POCZA, JF ^{[1
]}

POZSGAI, I ^{[1
]}

RADNOCZI, G ^{[1
]}

机构：

[1] HUNGARIAN ACAD PHYS,RES INST TECH PHYS,BUDAPEST,HUNGARY

来源：

THIN SOLID FILMS | 1974年 / 23卷 / 01期

关键词：

D O I：

10.1016/0040-6090(74)90216-8

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

引用

页码：49 / 62

页数：14

共 19 条

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[2]

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[3]

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[4]

BARNA A, 1972, JUGOSLAV KOMITET VAK, V12, P181

[5]

BIENENSTOCK AI, 1973, 5 P INT C AM LIQ SEM

[6]

Ehrenreich H., 1970, Comments on Solid State Physics, V3, P75

[7]

Fritzsche H., 1971, Journal of Non-Crystalline Solids, V6, P49, DOI 10.1016/0022-3093(71)90015-9

[8]

JOHANESSEN JS, 1972, AE140 ELAB REP

[9] THICKNESS DEPENDENCE OF HOPPING TRANSPORT IN AMORPHOUS-GE FILMS [J].

KNOTEK, ML ;

POLLAK, M ;

DONOVAN, TM ;

KURTZMAN, H .

PHYSICAL REVIEW LETTERS, 1973, 30 (18) :853-856

[10]

Moss S. C., 1973, Comments on Solid State Physics, V5, P47

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