FROZEN EPOXY-RESIN CRACKING METHOD FOR SCANNING ELECTRON-MICROSCOPY

被引：0

|

作者：

SHIMADA, T ^{[1
]}

MURAKAMI, M ^{[1
]}

机构：

[1] KURUME UNIV,SCH MED,DEPT ANAT 2,KURUME,JAPAN

来源：

JOURNAL OF ELECTRON MICROSCOPY | 1975年 / 24卷 / 03期

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中图分类号：

TH742 [显微镜];

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页码：199 / 199

页数：1

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