COLUMNAR EPITAXY OF PTSI ON SI(111)

被引:12
作者
FATHAUER, RW
XIAO, QF
HASHIMOTO, S
NIEH, CW
机构
[1] SUNY ALBANY,INST PARTICLE SOLID INTERACT,ALBANY,NY 12222
[2] SUNY ALBANY,DEPT PHYS,ALBANY,NY 12222
[3] CALTECH,KECK LAB ENGN,PASADENA,CA 91125
关键词
D O I
10.1063/1.103592
中图分类号
O59 [应用物理学];
学科分类号
摘要
Columnar grains of PtSi surrounded by high quality epitaxial silicon are obtained by ultrahigh vacuum codeposition of Si and Pt in an 8:1 ratio on Si(111) substrates heated to 610-810°C. The areal density of columns varies from 120 to 3.8 μm-2, and layers with thicknesses from 100 nm to 1 μm have been demonstrated. This result is similar to that found previously for CoSi2 (a nearly lattice-matched cubic-fluorite crystal) on Si(111), in spite of the orthorhombic structure of PtSi. The PtSi grains are also epitaxial and have one of three variants of the relation defined by PtSi(010)//Si(111), with PtSi[001]//Si〈110〉.
引用
收藏
页码:686 / 688
页数:3
相关论文
共 9 条
[1]  
FATHAUER RW, 1990, MATER RES SOC SYMP P, V160, P255
[2]   GROWTH OF SINGLE-CRYSTAL COLUMNS OF COSI2 EMBEDDED IN EPITAXIAL SI ON SI(111) BY MOLECULAR-BEAM EPITAXY [J].
FATHAUER, RW ;
NIEH, CW ;
XIAO, QF ;
HASHIMOTO, S .
APPLIED PHYSICS LETTERS, 1989, 55 (03) :247-249
[3]  
FATHAUER RW, 1990, NASA TECH BRIEFS, V14, P32
[4]   HYDROGEN-TERMINATED SILICON SUBSTRATES FOR LOW-TEMPERATURE MOLECULAR-BEAM EPITAXY [J].
GRUNTHANER, PJ ;
GRUNTHANER, FJ ;
FATHAUER, RW ;
LIN, TL ;
HECHT, MH ;
BELL, LD ;
KAISER, WJ ;
SCHOWENGERDT, FD ;
MAZUR, JH .
THIN SOLID FILMS, 1989, 183 :197-212
[5]   ON THE GROWTH OF COSI2 AND COSI/SI HETEROSTRUCTURES ON SI(111) [J].
HENZ, J ;
OSPELT, M ;
VONKANEL, H .
SOLID STATE COMMUNICATIONS, 1987, 63 (06) :445-449
[6]   CHANNELING AND BACKSCATTERING STUDIES OF THE CRYSTALLINE PERFECTION AND THE THERMAL-STABILITY OF EPITAXIAL PTSI FILMS ON SI [J].
ISHIWARA, H ;
HIKOSAKA, K ;
FURUKAWA, S .
JOURNAL OF APPLIED PHYSICS, 1979, 50 (08) :5302-5306
[7]   160X244 ELEMENT PTSI SCHOTTKY-BARRIER IR-CCD IMAGE SENSOR [J].
KOSONOCKY, WF ;
SHALLCROSS, FV ;
VILLANI, TS ;
GROPPE, JV .
IEEE TRANSACTIONS ON ELECTRON DEVICES, 1985, 32 (08) :1564-1573
[8]  
MURARKA SP, 1983, SILICIDES VLSI APPL, P15
[9]   THERMAL-STABILITY OF THIN PTSI FILMS ON SILICON SUBSTRATES [J].
SINHA, AK ;
SHENG, TT ;
MARCUS, RB ;
HASZKO, SE .
JOURNAL OF APPLIED PHYSICS, 1972, 43 (09) :3637-+