PROPORTIONALITY BETWEEN ION-BEAM-INDUCED EPITAXIAL REGROWTH IN SILICON AND NUCLEAR-ENERGY DEPOSITION

被引:106
作者
LINNROS, J
HOLMEN, G
SVENSSON, B
机构
来源
PHYSICAL REVIEW B | 1985年 / 32卷 / 05期
关键词
D O I
10.1103/PhysRevB.32.2770
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
引用
收藏
页码:2770 / 2777
页数:8
相关论文
共 41 条
[1]  
Andersen H. H., 1977, HYDROGEN STOPPING PO, V3
[2]  
[Anonymous], 1963, KGL DANSKE VIDENSKAB
[3]  
Bogh E., 1971, Radiation Effects, V7, P115, DOI 10.1080/00337577108232571
[4]  
BRICE DK, 1977, SAND750622 SAND LAB
[5]  
BRICE DK, 1975, ION IMPLANTATION RAN, V1
[6]   DETERMINATION OF RANDOM AND ALIGNED STOPPING POWERS FOR 80-300 KEV PROTONS IN SILICON BY BACKSCATTERING MEASUREMENTS [J].
CEMBALI, F ;
ZIGNANI, F .
RADIATION EFFECTS AND DEFECTS IN SOLIDS, 1977, 31 (03) :169-173
[7]   DISORDER PRODUCED BY HIGH-DOSE IMPLANTATION IN SI [J].
CSEPREGI, L ;
KENNEDY, EF ;
LAU, SS ;
MAYER, JW ;
SIGMON, TW .
APPLIED PHYSICS LETTERS, 1976, 29 (10) :645-648
[8]  
Elliman R. G., 1983, MATER RES SOC S P, V27, P229
[9]  
ELLIMAN RG, 1984, UNPUB P C ION BEAM M
[10]  
GERASIMENKO NN, 1973, SOV PHYS SEMICOND+, V6, P1588