SEMICONDUCTOR CORE-LEVEL TO VALENCE-BAND MAXIMUM BINDING-ENERGY DIFFERENCES - PRECISE DETERMINATION BY X-RAY PHOTOELECTRON-SPECTROSCOPY

被引:479
作者
KRAUT, EA
GRANT, RW
WALDROP, JR
KOWALCZYK, SP
机构
来源
PHYSICAL REVIEW B | 1983年 / 28卷 / 04期
关键词
D O I
10.1103/PhysRevB.28.1965
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
引用
收藏
页码:1965 / 1977
页数:13
相关论文
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