SEMICONDUCTOR CORE-LEVEL TO VALENCE-BAND MAXIMUM BINDING-ENERGY DIFFERENCES - PRECISE DETERMINATION BY X-RAY PHOTOELECTRON-SPECTROSCOPY

被引：472

作者：

KRAUT, EA

GRANT, RW

WALDROP, JR

KOWALCZYK, SP

机构：

来源：

PHYSICAL REVIEW B | 1983年 / 28卷 / 04期

关键词：

D O I：

10.1103/PhysRevB.28.1965

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

引用

收藏

页码：1965 / 1977

页数：13

相关论文

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