SYNTHESIS AND CHARACTERIZATION OF CHEMICALLY DEPOSITED Cd1-xPbxS THIN FILMS

被引:0
作者
Barote, M. A. [1 ]
Yadav, A. A. [2 ]
Deshmukh, L. P. [3 ]
Masumdar, E. U. [2 ]
机构
[1] Azad Coll, Dept Phys, Ausa 413520, Maharashtra, India
[2] Rajarshi Shahu Mahavidyalaya, Dept Phys, Thin Film Phys Lab, Latur 413512, Maharashtra, India
[3] Solapur Univ, Dept Phys, Thin Film & Solar Studies Res Lab, Solapur 413003, Maharashtra, India
来源
JOURNAL OF NON-OXIDE GLASSES | 2010年 / 2卷 / 03期
关键词
Chemical bath deposition; Cd1-xPbxS thin films; XRD; EDAX; SEM;
D O I
暂无
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
A simple and inexpensive chemical bath deposition technique is employed for the deposition of Cd1-xPbxS (0 <= x <= 1) thin films. Cadmium sulphate, lead sulphate and thiourea were used as the basic starting materials. Triethanolamine (TEA) was used as complexing agent. For good quality deposits the various preparative parameters such as deposition temperature, time, speed of substrate rotation and pH of the reaction mixture were optimized to 80 degrees C, 60 min., 65 rpm and 10.5 +/- 0.1 respectively. The 'as-grown' samples were characterized through structural, surface morphological, compositional, optical, electrical and thermoelectric studies. The colour of 'as-grown' samples went on changing from orange yellow to black with increase in composition parameter 'x' from 0 to 1. The thickness of the samples went on increasing with the composition parameter 'x'. The X-ray diffractograms of 'as-grown' samples exhibited polycrystalline nature with presence of cubic phases for CdS and PbS and hexagonal phase for CdS alone. The crystal size determined from XRD and SEM micrographs is observed to increase with 'x' up to 0.175 and later on it decreased. The energy dispersive analysis by X-rays (EDAX) revealed that films are cadmium rich. The optical study at room temperature revealed high coefficient of absorption (104 cm(-1)) with a direct allowed type of transition with band gap energy decreasing continuously from 2.47 eV to 0.49 eV with varying composition parameter 'x'. The electrical resistivity measurements revealed semiconducting nature of the film and it is found that the resistivity of the film decreases with increase in 'x' up to 0.175 and further it increases up to x = 1. The n-type conduction was observed in film from TEP studies.
引用
收藏
页码:151 / 165
页数:15
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