OXIDE FILM RUPTURE, REANODIZATION, AND STRESS-CORROSION CRACKING IN ALUMINUM

被引：11

作者：

ARNOTT, DR ^{[1
]}

BAXTER, WJ ^{[1
]}

ROUZE, SR ^{[1
]}

机构：

[1] GM CORP, RES LABS, DEPT PHYS, WARREN, MI 48090 USA

来源：

JOURNAL OF THE ELECTROCHEMICAL SOCIETY | 1982年 / 129卷 / 12期

关键词：

D O I：

10.1149/1.2123642

中图分类号：

O646 [电化学、电解、磁化学];

学科分类号：

081704 ;

摘要：

引用

页码：2660 / 2665

页数：6

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[6] PHOTOSTIMULATED EXOELECTRON EMISSION FROM SLIP LINES - NEW MICROSCOPY OF METAL DEFORMATION [J].

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[8]

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[9]

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