RADIATION-INDUCED CHANGES IN LOW-TEMPERATURE OXIDE MOS STRUCTURES (AL-SIO2-SI)

被引：1

作者：

LITOVCHENKO, VG ^{[1
]}

KIBLICK, VY ^{[1
]}

GEORGIEV, SS ^{[1
]}

KIROV, KI ^{[1
]}

机构：

[1] BULGARIAN ACAD SCI,INST SOLID STATE PHYS,BU-1184 SOFIA,BULGARIA

来源：

RADIATION EFFECTS AND DEFECTS IN SOLIDS | 1982年 / 62卷 / 1-2期

关键词：

D O I：

10.1080/00337578208235404

中图分类号：

TL [原子能技术]; O571 [原子核物理学];

学科分类号：

0827 ; 082701 ;

摘要：

引用

页码：1 / 5

页数：5

共 16 条

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