TOTALLY SELF-CHECKING CMOS CIRCUIT-DESIGN FOR BREAKS AND STUCK-ON FAULTS

This paper presents a new technique for designing totally self-checking FCMOS circuits. Two types of defects have been considered, e.g., breaks (caused by missing conducting material or extra insulating material) and transistor stuck-on faults. In order to make FCMOS circuits totally self-checking for all breaks and transistor stuck-on faults, only four extra transistors need to be added to the functional circuit. The additional circuitry is added in such a way that for any break or transistor stuck-on defect in the functional circuit, the outputs assume a value of 01 or 10, respectively. The output of the defect-free circuit will be 11 (00) when the input pattern applied to the circuit connects V(dd)(GND) to the output node.