SCANNING ELECTRON ACOUSTIC MICROSCOPY AND ITS APPLICATIONS

[11] DAVIES DG, 1983, SCANNING ELECTRON MI, V3, P1163

[12] DAVIES G, 1983, P SOC PHOTO-OPT INST, V368, P58, DOI 10.1117/12.934327

[13] THERMAL WAVE IMAGING OF GAAS MATERIAL AND DEVICES [J]. JOURNAL DE PHYSIQUE, 1984, 45 (NC-2): : 877 - 880

[14] Kubalek E., 1979, SCANNING ELECTRON MI, V1, P305

[15] NANISHI Y, 1983, JPN J APPL PHYS, V22, P54

[16] Pollard HF., 1977, SOUND WAVES SOLIDS, P115

[17] IMAGING OF DOPANT REGIONS IN SILICON WITH THERMAL-WAVE ELECTRON-MICROSCOPY [J]. APPLIED PHYSICS LETTERS, 1981, 38 (03) : 165 - 167

[18] APPLICATIONS OF THERMAL-WAVE PHYSICS TO SEMICONDUCTOR-MATERIALS ANALYSIS [J]. JOURNAL DE PHYSIQUE, 1983, 44 (NC-6): : 437 - 452

[19] ROSENCWAIG A, 1984, SCANNING ELECTRON MI, V4, P1611

[20] ROSENCWAIG A, 1980, SCANNED IMAGE MICROS, P291

[11] DAVIES DG, 1983, SCANNING ELECTRON MI, V3, P1163

[12] DAVIES G, 1983, P SOC PHOTO-OPT INST, V368, P58, DOI 10.1117/12.934327

[13] THERMAL WAVE IMAGING OF GAAS MATERIAL AND DEVICES [J]. JOURNAL DE PHYSIQUE, 1984, 45 (NC-2): : 877 - 880

[14] Kubalek E., 1979, SCANNING ELECTRON MI, V1, P305

[15] NANISHI Y, 1983, JPN J APPL PHYS, V22, P54

[16] Pollard HF., 1977, SOUND WAVES SOLIDS, P115

[17] IMAGING OF DOPANT REGIONS IN SILICON WITH THERMAL-WAVE ELECTRON-MICROSCOPY [J]. APPLIED PHYSICS LETTERS, 1981, 38 (03) : 165 - 167

[18] APPLICATIONS OF THERMAL-WAVE PHYSICS TO SEMICONDUCTOR-MATERIALS ANALYSIS [J]. JOURNAL DE PHYSIQUE, 1983, 44 (NC-6): : 437 - 452

[19] ROSENCWAIG A, 1984, SCANNING ELECTRON MI, V4, P1611

[20] ROSENCWAIG A, 1980, SCANNED IMAGE MICROS, P291