ON THE MEASUREMENT OF CONDUCTION CURRENT IN AC THIN-FILM ELECTROLUMINESCENT DISPLAY DEVICES

被引：4

作者：

SINGH, VP ^{[1
]}

MORTON, DC ^{[1
]}

机构：

[1] USA,ELECTR RES & DEV COMMAND,ELECTR TECHNOL & DEVICES LAB,DISPLAYS GRP,FT MONMOUTH,NJ 07703

来源：

IEEE ELECTRON DEVICE LETTERS | 1990年 / 11卷 / 12期

基金：

美国国家科学基金会;

关键词：

D O I：

10.1109/55.63043

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

Estimates are obtained for errors associated with the use of a capacitive bridge method for the measurement of the conduction current-time waveform in ac thin-film electroluminescent (ACTFEL) display devices. The error is a function of the shape and the slew rate of the excitation voltage pulses and can be quite large. In general, the bridge method underestimates the value of conduction current. An improved technique for measuring the current waveform is outlined. The new method is more accurate and is more generally applicable. © 1990 IEEE

引用

页码：573 / 575

页数：3

共 11 条

[1] ALT PM, 1984, P SID, V25, P123
[2] GUNADISASTRA P, 1989, THESIS U TEXAS EL PA
[3] THIN-FILM ELECTROLUMINESCENT DISPLAYS
HOWARD, WE
[J]. JOURNAL OF LUMINESCENCE, 1981, 24-5 (NOV) : 835 - 842
[4] A COMPUTATIONALLY SIMPLE-MODEL FOR HYSTERETIC THIN-FILM ELECTROLUMINESCENT DEVICES
JAREM, JM
SINGH, VP
[J]. IEEE TRANSACTIONS ON ELECTRON DEVICES, 1988, 35 (11) : 1834 - 1841
[5] KING CN, 1990, 1990 SID INT S, V21, P292
[6] ON THE TIME BEHAVIOR OF ELECTRON-IMPACT EXCITATION IN THIN-FILM ELECTROLUMINESCENT DEVICES
MACH, R
MULLER, GO
SCHULZ, G
[J]. PHYSICA STATUS SOLIDI A-APPLIED RESEARCH, 1984, 81 (02): : 723 - 732
[7] MILLER MR, 1982 SID INT S, P120
[8] OGAWA M, 1984, J LUMIN, V29, P11, DOI 10.1016/0022-2313(84)90037-1
[9] SINGH VP, 1988, IEEE T ELECTRON DEV, V35, P38, DOI 10.1109/16.2413
[10] SINGH VP, 1990, 1990 SID INT S LAS V, V21, P249

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