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- [1] APPLICATION OF ION-BEAM SPUTTERING FOR HIGH-RESOLUTION ELECTRON-MICROSCOPYJOURNAL OF ELECTRON MICROSCOPY TECHNIQUE, 1986, 4 (01): : 1 - 19KANAYA, KBABA, NMURANAKA, YADACHI, K
- [2] SOME APPLICATIONS OF ION-BEAM SPUTTERING TO HIGH-RESOLUTION ELECTRON-MICROSCOPYMICRON, 1977, 8 (03) : 151 - 170HOJOU, KOIKAWA, TKANAYA, KKIMURA, TADACHI, K
- [3] HIGH-RESOLUTION ATOMIC SHADOWING SPUTTERED BY ION-BEAM BOMBARDMENT FOR ELECTRON-MICROSCOPYJOURNAL OF ELECTRON MICROSCOPY, 1976, 25 (01): : 54 - 54ADACHI, KHOJOU, KKANAYA, K
- [4] HIGH-RESOLUTION ATOMIC SHADOWING SPUTTERED BY ION-BEAM BOMBARDMENT FOR ELECTRON-MICROSCOPYJOURNAL OF ELECTRON MICROSCOPY, 1975, 24 (03): : 214 - 214ADACHI, KHOJOU, KKANAYA, K
- [5] A CONTAMINATION REDUCING METHOD BY ION-BEAM BOMBARDMENT WITH THE SPECIMEN IN HIGH-RESOLUTION ELECTRON-MICROSCOPYEUREM 88, VOLS 1-3: TUTORIALS, INSTRUMENTATION AND TECHNIQUES / PHYSICS AND MATERIALS / BIOLOGY, 1988, 93 : 387 - 388KANAYA, KOHO, EMIZUKOSHI, N
- [6] A CONTAMINATION REDUCING METHOD BY ION-BEAM BOMBARDMENT WITH THE SPECIMEN IN HIGH-RESOLUTION ELECTRON-MICROSCOPYINSTITUTE OF PHYSICS CONFERENCE SERIES, 1988, (93): : 387 - 388KANAYA, KOHO, EMIZUKOSHI, N
- [7] QUANTITATIVE-ANALYSIS OF SPUTTERING DUE TO ION-BEAM BOMBARDMENT OF SOLIDS AND BIOLOGICAL SPECIMENS IN HIGH-RESOLUTION ELECTRON-MICROSCOPYMICRON AND MICROSCOPICA ACTA, 1992, 23 (1-2): : 45 - 64KANAYA, KMURANAKA, YYONEHARA, KADACHI, K
- [8] A CONTAMINATION REDUCING METHOD BY ION-BEAM BOMBARDMENT OF THE SPECIMEN IN HIGH-RESOLUTION ELECTRON-MICROSCOPYMICRON AND MICROSCOPICA ACTA, 1988, 19 (03): : 163 - 173KANAYA, KOHO, EOSAKI, NODA, T
- [9] HIGH-RESOLUTION FABRICATION BY ION-BEAM SPUTTERINGSOLID STATE TECHNOLOGY, 1973, 16 (11) : 31 - 36GARVIN, HL
- [10] A CONTAMINATION-REDUCING METHOD BY ION-BEAM BOMBARDMENT OF THE SPECIMEN IN HIGH-RESOLUTION ELECTRON-MICROSCOPYJOURNAL OF ELECTRON MICROSCOPY, 1988, 37 (05): : 261 - 261KANAYA, KOHO, EOGIHARA, A