INSITU WORK FUNCTION MEASUREMENTS IN EVAPORATED AMORPHOUS-SILICON

被引：9
|
作者：
UKAH, CI [1 ]
KRUZELECKY, RV [1 ]
RACANSKY, D [1 ]
ZUKOTYNSKI, S [1 ]
PERZ, JM [1 ]
机构：
[1] UNIV TORONTO,DEPT PHYS,TORONTO M5S 1A7,ONTARIO,CANADA
来源：
JOURNAL OF NON-CRYSTALLINE SOLIDS | 1988年 / 103卷 / 01期
关键词：
The authors wish to acknowledge the financial support of the Natural Sciences and Engineering Research Council and of the Solar Energy Project of the National Research Council of Canada. One of us (C.I.U.) would like to acknowledge the financial assistance of The Federal University; Owerri; Nigeria;
D O I：
10.1016/0022-3093(88)90425-5
中图分类号：
TQ174 [陶瓷工业]; TB3 [工程材料学];
学科分类号：
0805 ; 080502 ;
摘要：
引用
收藏
页码：131 / 136
页数：6
相关论文
共 50 条
  • [21] ELECTRICAL NOISE MEASUREMENTS IN INTRINSIC AMORPHOUS-SILICON
    BATHAEI, FZ
    ANDERSON, JC
    PHILOSOPHICAL MAGAZINE B-PHYSICS OF CONDENSED MATTER STATISTICAL MECHANICS ELECTRONIC OPTICAL AND MAGNETIC PROPERTIES, 1987, 55 (01): : 87 - 100
  • [22] THETA-PINCH PLASMA HYDROGENATION OF EVAPORATED AMORPHOUS-SILICON FILMS
    JOHN, PK
    WONG, SK
    GOGNA, PK
    TONG, BY
    CHIK, KP
    JOURNAL DE PHYSIQUE, 1981, 42 (NC4): : 639 - 642
  • [23] THE INTERPRETATION OF PHOTOCONDUCTIVITY MEASUREMENTS IN HYDROGENATED AMORPHOUS-SILICON
    PICKIN, W
    SOLAR CELLS, 1983, 9 (1-2): : 95 - 111
  • [24] INSITU INVESTIGATION OF AMORPHOUS-SILICON SILICON-NITRIDE INTERFACES BY INFRARED ELLIPSOMETRY
    SHIRAI, H
    DREVILLON, B
    OSSIKOVSKI, R
    APPLIED PHYSICS LETTERS, 1993, 62 (22) : 2833 - 2835
  • [25] MEASUREMENTS OF DEPLETION LAYERS IN HYDROGENATED AMORPHOUS-SILICON
    STREET, RA
    PHYSICAL REVIEW B, 1983, 27 (08): : 4924 - 4932
  • [26] ANNEALING BEHAVIOR OF SPIN-DENSITY IN UHV EVAPORATED AMORPHOUS-SILICON
    YONEHARA, T
    SAITOH, T
    KAWARADA, H
    HIRATA, T
    KAKUMU, M
    OHDOMARI, I
    PHYSICS LETTERS A, 1980, 78 (02) : 192 - 194
  • [27] NEUTRON-DIFFRACTION STUDY OF THE STRUCTURE OF EVAPORATED PURE AMORPHOUS-SILICON
    KUGLER, S
    MOLNAR, G
    PETO, G
    ZSOLDOS, E
    ROSTA, L
    MENELLE, A
    BELLISSENT, R
    PHYSICAL REVIEW B, 1989, 40 (11) : 8030 - 8032
  • [28] HYDROGENATION AND DIRECT-SUBSTITUTIONAL DOPING OF EVAPORATED AMORPHOUS-SILICON FILMS
    ISELBORN, S
    RUBEL, H
    GEIGER, J
    SCHRODER, B
    PHILOSOPHICAL MAGAZINE B-PHYSICS OF CONDENSED MATTER STATISTICAL MECHANICS ELECTRONIC OPTICAL AND MAGNETIC PROPERTIES, 1983, 48 (06): : 561 - 569
  • [29] STRUCTURAL DIFFERENCE OF SURFACE AND SUBSURFACE NATIVE OXIDES OF EVAPORATED AMORPHOUS-SILICON
    TADA, M
    OHSAKI, H
    AEGERTER, MA
    JOURNAL OF NON-CRYSTALLINE SOLIDS, 1990, 120 (1-3) : 275 - 282
  • [30] INSITU OBSERVATION OF ELECTRON-SPIN RESONANCE IN EVAPORATED AMORPHOUS SILICON
    THOMAS, PA
    LEPINE, D
    KAPLAN, D
    BULLETIN OF THE AMERICAN PHYSICAL SOCIETY, 1974, 19 (03): : 387 - 387
12345