CONVERGENT-BEAM TECHNIQUES IN TRANSMISSION ELECTRON-MICROSCOPY

[1] FOIL THICKNESS MEASUREMENTS FROM CONVERGENT-BEAM DIFFRACTION PATTERNS - AN EXPERIMENTAL ASSESSMENT OF ERRORS [J]. PHILOSOPHICAL MAGAZINE A-PHYSICS OF CONDENSED MATTER STRUCTURE DEFECTS AND MECHANICAL PROPERTIES, 1982, 46 (02): : 243 - 253

[2] FOIL THICKNESS MEASUREMENTS FROM CONVERGENT-BEAM DIFFRACTION PATTERNS [J]. PHILOSOPHICAL MAGAZINE A-PHYSICS OF CONDENSED MATTER STRUCTURE DEFECTS AND MECHANICAL PROPERTIES, 1981, 43 (02): : 325 - 335

[3] SYMMETRY OF ELECTRON-DIFFRACTION ZONE AXIS PATTERNS [J]. PHILOSOPHICAL TRANSACTIONS OF THE ROYAL SOCIETY A-MATHEMATICAL PHYSICAL AND ENGINEERING SCIENCES, 1976, 281 (1301): : 171 - +

[4] 3-DIMENSIONAL STRAIN-FIELD INFORMATION IN CONVERGENT-BEAM ELECTRON-DIFFRACTION PATTERNS [J]. ACTA CRYSTALLOGRAPHICA SECTION A, 1982, 38 (JAN): : 55 - &

[5] APPLICATIONS OF MODERN MICRODIFFRACTION TO MATERIALS SCIENCE [J]. JOURNAL OF MICROSCOPY-OXFORD, 1984, 136 (NOV): : 165 - 178

[6] DIRECT RESOLUTION OF SURFACE ATOMIC STEPS BY TRANSMISSION ELECTRON-MICROSCOPY [J]. PHILOSOPHICAL MAGAZINE, 1974, 30 (03): : 549 - 556

[7] COWLEY JM, 1979, ADV ELECTRONICS ELEC, V46, P1

[8] COWLEY JM, 1979, ULTRAMICROSCOPY, V3, P433

[9] EADES JA, 1983, SCANNING ELECTRON MI, V3, P1051

[10] EADES JA, NORELCO REPORTER

[1] FOIL THICKNESS MEASUREMENTS FROM CONVERGENT-BEAM DIFFRACTION PATTERNS - AN EXPERIMENTAL ASSESSMENT OF ERRORS [J]. PHILOSOPHICAL MAGAZINE A-PHYSICS OF CONDENSED MATTER STRUCTURE DEFECTS AND MECHANICAL PROPERTIES, 1982, 46 (02): : 243 - 253

[2] FOIL THICKNESS MEASUREMENTS FROM CONVERGENT-BEAM DIFFRACTION PATTERNS [J]. PHILOSOPHICAL MAGAZINE A-PHYSICS OF CONDENSED MATTER STRUCTURE DEFECTS AND MECHANICAL PROPERTIES, 1981, 43 (02): : 325 - 335

[3] SYMMETRY OF ELECTRON-DIFFRACTION ZONE AXIS PATTERNS [J]. PHILOSOPHICAL TRANSACTIONS OF THE ROYAL SOCIETY A-MATHEMATICAL PHYSICAL AND ENGINEERING SCIENCES, 1976, 281 (1301): : 171 - +

[4] 3-DIMENSIONAL STRAIN-FIELD INFORMATION IN CONVERGENT-BEAM ELECTRON-DIFFRACTION PATTERNS [J]. ACTA CRYSTALLOGRAPHICA SECTION A, 1982, 38 (JAN): : 55 - &

[5] APPLICATIONS OF MODERN MICRODIFFRACTION TO MATERIALS SCIENCE [J]. JOURNAL OF MICROSCOPY-OXFORD, 1984, 136 (NOV): : 165 - 178

[6] DIRECT RESOLUTION OF SURFACE ATOMIC STEPS BY TRANSMISSION ELECTRON-MICROSCOPY [J]. PHILOSOPHICAL MAGAZINE, 1974, 30 (03): : 549 - 556

[7] COWLEY JM, 1979, ADV ELECTRONICS ELEC, V46, P1

[8] COWLEY JM, 1979, ULTRAMICROSCOPY, V3, P433

[9] EADES JA, 1983, SCANNING ELECTRON MI, V3, P1051

[10] EADES JA, NORELCO REPORTER