CONVERGENT-BEAM TECHNIQUES IN TRANSMISSION ELECTRON-MICROSCOPY

被引：14
作者：
EADES, JA
机构：
来源：
APPLIED SURFACE SCIENCE | 1986年 / 26卷 / 03期
关键词：
D O I：
10.1016/0169-4332(86)90069-3
中图分类号：
O64 [物理化学（理论化学）、化学物理学];
学科分类号：
070304 ; 081704 ;
摘要：
引用
收藏
页码：280 / 293
页数：14
相关论文
共 49 条
[1]   FOIL THICKNESS MEASUREMENTS FROM CONVERGENT-BEAM DIFFRACTION PATTERNS - AN EXPERIMENTAL ASSESSMENT OF ERRORS [J].
ALLEN, SM ;
HALL, EL .
PHILOSOPHICAL MAGAZINE A-PHYSICS OF CONDENSED MATTER STRUCTURE DEFECTS AND MECHANICAL PROPERTIES, 1982, 46 (02) :243-253
[2]   FOIL THICKNESS MEASUREMENTS FROM CONVERGENT-BEAM DIFFRACTION PATTERNS [J].
ALLEN, SM .
PHILOSOPHICAL MAGAZINE A-PHYSICS OF CONDENSED MATTER STRUCTURE DEFECTS AND MECHANICAL PROPERTIES, 1981, 43 (02) :325-335
[3]   SYMMETRY OF ELECTRON-DIFFRACTION ZONE AXIS PATTERNS [J].
BUXTON, BF ;
EADES, JA ;
STEEDS, JW ;
RACKHAM, GM .
PHILOSOPHICAL TRANSACTIONS OF THE ROYAL SOCIETY A-MATHEMATICAL PHYSICAL AND ENGINEERING SCIENCES, 1976, 281 (1301) :171-+
[4]   3-DIMENSIONAL STRAIN-FIELD INFORMATION IN CONVERGENT-BEAM ELECTRON-DIFFRACTION PATTERNS [J].
CARPENTER, RW ;
SPENCE, JCH .
ACTA CRYSTALLOGRAPHICA SECTION A, 1982, 38 (JAN) :55-&
[5]   APPLICATIONS OF MODERN MICRODIFFRACTION TO MATERIALS SCIENCE [J].
CARPENTER, RW ;
SPENCE, JCH .
JOURNAL OF MICROSCOPY-OXFORD, 1984, 136 (NOV) :165-178
[6]   DIRECT RESOLUTION OF SURFACE ATOMIC STEPS BY TRANSMISSION ELECTRON-MICROSCOPY [J].
CHERNS, D .
PHILOSOPHICAL MAGAZINE, 1974, 30 (03) :549-556
[7]  
COWLEY JM, 1979, ADV ELECTRONICS ELEC, V46, P1
[8]  
COWLEY JM, 1979, ULTRAMICROSCOPY, V3, P433
[9]  
EADES JA, 1983, SCANNING ELECTRON MI, V3, P1051
[10]  
EADES JA, NORELCO REPORTER
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