COMPACT INTERFEROMETER FOR ACCURATE DETERMINATION OF OPTICAL-CONSTANTS OF THIN-FILMS

被引：11

作者：

SHAMIR, J ^{[1
]}

机构：

[1] TECHNION ISRAEL INST TECHNOL,FAC ELECT ENGN,HAIFA,ISRAEL

来源：

JOURNAL OF PHYSICS E-SCIENTIFIC INSTRUMENTS | 1976年 / 9卷 / 06期

关键词：

D O I：

10.1088/0022-3735/9/6/022

中图分类号：

TH7 [仪器、仪表];

学科分类号：

0804 ; 080401 ; 081102 ;

摘要：

引用

页码：499 / 503

页数：5

共 7 条

[1] Born M., 1959, PRINCIPLES OPTICS
[2] CONTRIBUTION TO INTERFEROMETRIC MEASUREMENT OF SUBANGSTROM VIBRATIONS
KWAAITAAL, T
[J]. REVIEW OF SCIENTIFIC INSTRUMENTS, 1974, 45 (01) : 39 - 41
[3] HIGH PRECISION PATH DIFFERENCE MEASUREMENT
LOVINS, GH
[J]. APPLIED OPTICS, 1970, 9 (08): : 1935 - &
[4] HIGH-PRECISION POINTING INTERFEROMETER
LOVINS, GH
[J]. APPLIED OPTICS, 1964, 3 (07): : 883 - &
[5] AN INTERFEROMETER FOR MEASURING GRADIENTS IN BOTH REFRACTIVE INDEX AND THICKNESS OF LARGE OR SMALL OPTICS
SAUNDERS, JB
[J]. JOURNAL OF RESEARCH OF THE NATIONAL BUREAU OF STANDARDS SECTION C-ENGINEERING AND INSTRUMENTATION, 1969, C 73 (1-2): : 1 - +
[6] A SIMPLE METHOD OF MEASURING VERY SMALL FRINGE SHIFTS
SHAMIR, J
FOX, R
LIPSON, SG
[J]. APPLIED OPTICS, 1969, 8 (01): : 103 - &
[7] OPTICAL PARAMETERS OF PARTIALLY TRANSMITTING THIN-FILMS .1. BASIC THEORY OF A NOVEL METHOD FOR THEIR DETERMINATIONS
SHAMIR, J
GRAFF, P
[J]. APPLIED OPTICS, 1975, 14 (12): : 3053 - 3056