A SIMPLE METHOD FOR DEPOSITING THIN-FILMS ON THE SURFACE OF TRANSMISSION ELECTRON-MICROSCOPE SPECIMENS

被引：0

作者：

BOONE, T

机构：

[1] AT&T Bell Laboratories, Murray Hill, NJ 07974, United States

来源：

ULTRAMICROSCOPY | 1984年 / 14卷 / 04期

关键词：

THIN FILM DEPOSITION METHOD - TRANSMISSION ELECTRON MICROSCOPE;

D O I：

10.1016/0304-3991(84)90222-5

中图分类号：

TH742 [显微镜];

学科分类号：

摘要：

引用

页码：359 / 361

页数：3

共 50 条

[1] THIN-FILMS AND BULK SPECIMENS X-RAY MICROANALYSIS WITH A TRANSMISSION ELECTRON-MICROSCOPE
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[8] A TECHNIQUE FOR COMPARING THE BULK AND SURFACE-STRUCTURE OF DEFECTS IN THIN-FILMS USING THE SCANNING-TRANSMISSION ELECTRON-MICROSCOPE
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