WAVINESS EFFECTS IN RAY-TRACING OF REAL OPTICAL-SURFACES

Today ray-tracing calculations are playing an essential role in the design of synchrotron radiation beamlines. In particular, for the new generation of synchrotron radiation machines that will produce high brightness X-ray beams, the low emittance must be conserved along the beamline by choosing the best optical design. Quality of optical elements is limited by the technological manufacturing process, characterized by the values of roughness and waviness of the optical surfaces. Therefore a reliable description of an optical element is essential for having accurate results in ray-tracing simulations. We present here a model for introducing the waviness effect of real optics surfaces in ray-tracing calculations and also show some examples of simulated surfaces in comparison with real measured surfaces.