I/F NOISE STUDY IN YBCO THIN-FILMS WITH DIFFERENT OXYGEN STOICHIOMETRY

被引：2

作者：

LIN, CL ^{[1
]}

CHI, CC ^{[1
]}

CHEN, CC ^{[1
]}

WU, MK ^{[1
]}

机构：

[1] NATL TSING HUA UNIV,DEPT PHYS,HSINCHU 300,TAIWAN

来源：

PHYSICA C | 1994年 / 235卷

关键词：

D O I：

10.1016/0921-4534(94)92116-4

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

We present our study of 1/f noise in YBa2Cu3Ox (YBCO) thin films that have distinctive resistance characteristics due to different oxygen deficiency. We observe that the noise behavior is not significantly dependent on oxygen concentration and appears to be uncorrelated with the temperature dependence of the resistance. These results suggest that the major contributions to 1/f noise and the resistance have different origins. From the noise characteristics in YBCO thin film with different oxygen content, we confirm that the noise is not of bulk origin.

引用

页码：1789 / 1790

页数：2