MULTIPLE-SCATTERING CALCULATIONS OF X-RAY-ABSORPTION SPECTRA

被引:2777
作者
ZABINSKY, SI
REHR, JJ
ANKUDINOV, A
ALBERS, RC
ELLER, MJ
机构
[1] LOS ALAMOS NATL LAB, DIV THEORET, LOS ALAMOS, NM 87545 USA
[2] MICROSOFT CORP, REDMOND, WA 98052 USA
来源
PHYSICAL REVIEW B | 1995年 / 52卷 / 04期
关键词
D O I
10.1103/PhysRevB.52.2995
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
A high-order multiple-scattering (MS) approach to the calculation of polarized x-ray-absorption spectra, which includes both x-ray-absorption fine structure and x-ray-absorption near-edge structure, is presented. Efficient calculations in arbitrary systems are carried out by using a curved-wave MS path formalism that ignores negligible paths, and has an energy-dependent self-energy and MS Debye-Waller factors. Embedded-atom background absorption calculations on an absolute energy scale are included. The theory is illustrated for metallic Cu, Cd, and Pt. For these cases the MS expansion is found to converge to within typical experimental accuracy, both to experiment and to full MS theories (e.g., band structure), by using only a few dozen important paths, which are primarily single-scattering, focusing, linear, and triangular.
引用
收藏
页码:2995 / 3009
页数:15
相关论文
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