SIMPLE ANALYTICAL EXPRESSION FOR THE SIZE EFFECT IN THIN METAL WIRES

被引：3
作者：
TOSSER, AJ
MESSAADI, S
PICHARD, CR
HUMBERT, E
机构：
来源：
JOURNAL OF MATERIALS SCIENCE LETTERS | 1986年 / 5卷 / 11期
关键词：
D O I：
10.1007/BF01742238
中图分类号：
T [工业技术];
学科分类号：
08 ;
摘要：
引用
收藏
页码：1175 / 1177
页数：3
相关论文
共 10 条
  • [1] THE SIZE-VARIATION OF RESISTIVITY FOR MERCURY AND TIN
    ANDREW, ER
    [J]. PROCEEDINGS OF THE PHYSICAL SOCIETY OF LONDON SECTION A, 1949, 62 (350): : 77 - 88
  • [2] [Anonymous], [No title captured]
  • [3] ANALYTICAL EXPRESSION FOR THE TOTAL ELECTRICAL-CONDUCTIVITY OF UNANNEALED AND ANNEALED METAL-FILMS
    BEDDA, M
    MESSAADI, S
    PICHARD, CR
    TOSSER, AJ
    [J]. JOURNAL OF MATERIALS SCIENCE, 1986, 21 (08) : 2643 - 2647
  • [4] NUMERICAL APPROXIMATIONS FOR TRANSPORT PARAMETERS IN THE FRAMEWORK OF MULTIDIMENSIONAL CONDUCTION MODELS
    BEDDA, M
    PICHARD, CR
    TOSSER, AJ
    [J]. JOURNAL OF MATERIALS SCIENCE, 1986, 21 (04) : 1405 - 1412
  • [5] THE CONDUCTIVITY OF THIN WIRES IN A MAGNETIC FIELD
    CHAMBERS, RG
    [J]. PROCEEDINGS OF THE ROYAL SOCIETY OF LONDON SERIES A-MATHEMATICAL AND PHYSICAL SCIENCES, 1950, 202 (1070): : 378 - 394
  • [6] THE ELECTRICAL CONDUCTIVITY OF THIN WIRES
    DINGLE, RB
    [J]. PROCEEDINGS OF THE ROYAL SOCIETY OF LONDON SERIES A-MATHEMATICAL AND PHYSICAL SCIENCES, 1950, 201 (1067): : 545 - 560
  • [7] MESSAADI S, COMMUNICATION
  • [8] ALTERNATIVE ANALYTICAL FORMS OF THE FUCHS-SONDHEIMER FUNCTION
    PICHARD, CR
    BEDDA, M
    VATAMANYUK, VI
    TOSSER, AJ
    TELLIER, CR
    [J]. JOURNAL OF MATERIALS SCIENCE, 1985, 20 (11) : 4185 - 4201
  • [9] THE MEAN FREE PATH OF ELECTRONS IN METALS
    SONDHEIMER, EH
    [J]. ADVANCES IN PHYSICS, 1952, 1 (01) : 1 - 42
  • [10] TELLIER CR, 1982, SIZE EFFECTS THIN FI, pCH1
1