NODE-FAULT DIAGNOSIS AND A DESIGN OF TESTABILITY

被引：37

作者：

HUANG, ZF

LIN, CS

LIU, RW

机构：

来源：

IEEE TRANSACTIONS ON CIRCUITS AND SYSTEMS | 1983年 / 30卷 / 05期

关键词：

D O I：

10.1109/TCS.1983.1085359

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

引用

页码：257 / 265

页数：9

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