EFFECTS OF QUENCHING AND FISSION DAMAGE ON THE LOW-TEMPERATURE ELECTRICAL-RESISTIVITY OF SINGLE-CRYSTAL UC

被引：5

|

作者：

MATSUI, H

HORIKI, M

OHYA, N

KATO, T

OSADA, M

机构：

来源：

JOURNAL OF NUCLEAR MATERIALS | 1983年 / 115卷 / 01期

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D O I：

10.1016/0022-3115(83)90351-3

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

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页码：128 / 130

页数：3

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