EFFECT OF SURFACE TREATMENT ON GALLIUM ARSENIDE SCHOTTKY BARRIER DIODES

被引:21
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SMITH, BL
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10.1016/0038-1101(68)90034-8
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TM [电工技术]; TN [电子技术、通信技术];
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0808 ; 0809 ;
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页码:502 / &
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[2]   RICHARDSON CONSTANT FOR THERMIONIC EMISSION IN SCHOTTKY BARRIER DIODES [J].
CROWELL, CR .
SOLID-STATE ELECTRONICS, 1965, 8 (04) :395-&
[3]   CURRENT TRANSPORT IN METAL-SEMICONDUCTOR BARRIERS [J].
CROWELL, CR ;
SZE, SM .
SOLID-STATE ELECTRONICS, 1966, 9 (11-1) :1035-&
[4]   TRANSIENT PHENOMENA IN CAPACITANCE AND REVERSE CURRENT IN A GAAS SCHOTTKY BARRIER DIODE [J].
FURUKAWA, Y ;
ISHIBASHI, Y .
JAPANESE JOURNAL OF APPLIED PHYSICS, 1967, 6 (01) :13-+
[5]   TRANSIENT PHENOMENA IN CAPACITANCE OF GAAS SCHOTTKY BARRIER DIODES [J].
FURUKAWA, Y ;
ISHIBASHI, Y .
JAPANESE JOURNAL OF APPLIED PHYSICS, 1966, 5 (09) :837-+
[6]   TRAPPING EFFECTS IN AU-N-TYPE GAAS SCHOTTKY BARRIER DIODES [J].
FURUKAWA, Y ;
ISHIBASHI, Y .
JAPANESE JOURNAL OF APPLIED PHYSICS, 1967, 6 (04) :503-+
[8]   THE CHEMICAL POLISHING OF GALLIUM ARSENIDE IN BROMINE-METHANOL [J].
SULLIVAN, MV ;
KOLB, GA .
JOURNAL OF THE ELECTROCHEMICAL SOCIETY, 1963, 110 (06) :585-587
[9]  
WHITE JG, 1959, J APPL PHYS, V30
[10]   DETERMINATION OF DEEP CENTERS IN CONDUCTING GALLIUM ARSENIDE [J].
WILLIAMS, R .
JOURNAL OF APPLIED PHYSICS, 1966, 37 (09) :3411-&