A voltage-mode DC-DC buck converter with fast output voltage-tracking speed and wide output voltage range

被引:0
作者
Yang Miao [1 ]
Zhang Baixue [1 ]
Cao Yun [2 ]
Sun Fengfeng [2 ]
Sun Weifeng [2 ]
机构
[1] China Elect Technol Grp Corp, Res Inst 55, Nanjing 210016, Jiangsu, Peoples R China
[2] Southeast Univ, Natl ASIC Syst Engn Res Ctr, Nanjing 210096, Jiangsu, Peoples R China
关键词
DC-DC buck converter; voltage-mode; voltage-tracking speed;
D O I
10.1088/1674-4926/35/5/055005
中图分类号
O469 [凝聚态物理学];
学科分类号
070205 ;
摘要
A high switching frequency voltage-mode buck converter with fast voltage-tracking speed and wide output voltage range has been proposed. A novel error amplifier (EA) is presented to achieve a high DC gain and get high phase margin, including a resistor and capacitor net, a unit gain block and a high gain block. The investigated converter has been fabricated with GF 0.35 mu m CMOS process and can operate at 6 MHz with the output voltage range from 0.6 to 3.4 V. The experimental results show that the voltage-tracking speed can achieve 8.8 mu s/V for up-tracking and 6 mu s/V for down-tracking. Besides, the recovery time is less than 8 mu s while the load current suddenly changes 400 mA.
引用
收藏
页数:5
相关论文
共 5 条
  • [1] Chen H., 2011, P IEEE S VLSI CIRC, P282
  • [2] A 5-MHz 91% Peak-Power-Efficiency Buck Regulator With Auto-Selectable Peak- and Valley-Current Control
    Du, Mengmeng
    Lee, Hoi
    Liu, Jin
    [J]. IEEE JOURNAL OF SOLID-STATE CIRCUITS, 2011, 46 (08) : 1928 - 1939
  • [3] Power-Tracking Embedded Buck-Boost Converter With Fast Dynamic Voltage Scaling for the SoC System
    Lee, Yu-Huei
    Huang, Shao-Chang
    Wang, Shih-Wei
    Wu, Wei-Chan
    Huang, Ping-Ching
    Ho, Hsin-Hsin
    Lai, Yuan-Tai
    Chen, Ke-Horng
    [J]. IEEE TRANSACTIONS ON POWER ELECTRONICS, 2012, 27 (03) : 1271 - 1282
  • [4] Ultra fast fixed-frequency hysteretic buck converter with maximum charging current control and adaptive delay compensation for DVS applications
    Su, Feng
    Ki, Wing-Hung
    Tsui, Chi-Ying
    [J]. IEEE JOURNAL OF SOLID-STATE CIRCUITS, 2008, 43 (04) : 815 - 822
  • [5] Tan M, 2010, IEEE INT C EL DEV SO