OPTICAL DESIGN FOR SOFT-X-RAY PROJECTION LITHOGRAPHY

被引:6
作者
WATANABE, Y
SUZUKI, M
MOCHIZUKI, N
NIIBE, M
FUKUDA, Y
机构
[1] Canon Research Center, Atsugi, Kanagawa
来源
JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES & REVIEW PAPERS | 1991年 / 30卷 / 11B期
关键词
SOFT X-RAY PROJECTION LITHOGRAPHY; MULTILAYER MIRROR; AMPLITUDE REFLECTANCE; PHASE SHIFT; DISTORTION; POINT SPREAD FUNCTION; MODULATION TRANSFER FUNCTION;
D O I
10.1143/JJAP.30.3053
中图分类号
O59 [应用物理学];
学科分类号
摘要
We investigated the effect of soft X-ray multilayer mirrors on the characteristics of image formation and determined that the phase shift of the X-ray on the mirror plays an important role in image formation as well as reflectivity. Under such a condition that the effect on the characteristics of image formation can be neglected, an optical system that has a resolution of 0.18-mu-m and 0.25-mu-m at the wavelength of 5 nm and 13 nm, respectively, and distortion of less than 0.01-mu-m in a whole exposure field of 20 x 40 mm2. The necessary surface accuracy of mirrors and tolerance of setting mirrors are discussed.
引用
收藏
页码:3053 / 3057
页数:5
相关论文
共 6 条
[1]   REDUCTION IMAGING AT 14 NM USING MULTILAYER-COATED OPTICS - PRINTING OF FEATURES SMALLER THAN 0.1-MU-M [J].
BJORKHOLM, JE ;
BOKOR, J ;
EICHNER, L ;
FREEMAN, RR ;
GREGUS, J ;
JEWELL, TE ;
MANSFIELD, WM ;
MACDOWELL, AA ;
RAAB, EL ;
SILFVAST, WT ;
SZETO, LH ;
TENNANT, DM ;
WASKIEWICZ, WK ;
WHITE, DL ;
WINDT, DL ;
WOOD, OR ;
BRUNING, JH .
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, 1990, 8 (06) :1509-1513
[2]  
HENKE BL, 1988, LOW ENERGY XRAY INTE
[3]   REFLECTIVE SYSTEMS-DESIGN STUDY FOR SOFT-X-RAY PROJECTION LITHOGRAPHY [J].
JEWELL, TE ;
RODGERS, JM ;
THOMPSON, KP .
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, 1990, 8 (06) :1519-1523
[4]   SOFT-X-RAY REDUCTION LITHOGRAPHY USING MULTILAYER MIRRORS [J].
KINOSHITA, H ;
KURIHARA, K ;
ISHII, Y ;
TORII, Y .
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, 1989, 7 (06) :1648-1651
[5]  
Lai B., 1985, Proceedings of the SPIE - The International Society for Optical Engineering, V563, P174, DOI 10.1117/12.949666
[6]  
PERKINS RT, 1986, SPIE, V691, P76