ELECTRO-THERMOMIGRATION IN AL-SI, AU-SI INTERDIGITIZED TEST STRUCTURES

被引：8

作者：

CHRISTOU, A ^{[1
]}

机构：

[1] USN,RES LAB,WASHINGTON,DC 20390

来源：

关键词：

D O I：

10.1063/1.1662692

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

引用

页码：2975 / 2979

页数：5

共 19 条

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