AUGER-ELECTRON SPECTROSCOPY OF LAYERED GROWTH OF TITANIUM ON TUNGSTEN

被引：15
作者：
ARMSTRONG, RA [1 ]
机构：
[1] NATL RES COUNCIL,RADIO & ELECT ENGN DIV,OTTAWA,ONTARIO,CANADA
来源：
SURFACE SCIENCE | 1975年 / 50卷 / 02期
关键词：
D O I：
10.1016/0039-6028(75)90050-3
中图分类号：
O64 [物理化学（理论化学）、化学物理学];
学科分类号：
070304 ; 081704 ;
摘要：
引用
收藏
页码：615 / 620
页数：6
相关论文
共 50 条
[11]   STUDY OF PREPARATION OF ATOMICALLY CLEAN TUNGSTEN SURFACES BY AUGER-ELECTRON SPECTROSCOPY [J].
JOYNER, RW ;
RICKMAN, J ;
ROBERTS, MW .
SURFACE SCIENCE, 1973, 39 (02) :445-449
[12]   INTRODUCTION TO AUGER-ELECTRON SPECTROSCOPY [J].
CALOW, JT .
JOURNAL OF SUBMICROSCOPIC CYTOLOGY AND PATHOLOGY, 1978, 10 (01) :154-154
[13]   LEED AND AUGER-ELECTRON SPECTROSCOPY [J].
HAYAKAWA, K .
JOURNAL OF JAPAN SOCIETY OF LUBRICATION ENGINEERS, 1974, 19 (03) :237-242
[14]   BACKGROUND IN AUGER-ELECTRON SPECTROSCOPY [J].
LANGERON, JP .
VACUUM, 1988, 38 (11) :1054-1054
[15]   AUGER-ELECTRON SPECTROSCOPY - REVIEW [J].
JOHNSON, WC ;
JOSHI, A ;
STEIN, DF .
CANADIAN JOURNAL OF SPECTROSCOPY, 1972, 17 (03) :88-&
[16]   DECONVOLUTION IN AUGER-ELECTRON SPECTROSCOPY [J].
CHORNIK, B ;
BISHOP, HE ;
LEMOEL, A ;
LEGRESSUS, C .
SCANNING ELECTRON MICROSCOPY, 1986, 1986 :77-88
[17]   APPLICATIONS OF AUGER-ELECTRON SPECTROSCOPY [J].
不详 .
RESEARCH-DEVELOPMENT, 1973, 24 (07) :36-38
[18]   QUANTITATIVE AUGER-ELECTRON SPECTROSCOPY [J].
CAILLER, M ;
GANACHAUD, JP ;
ROPTIN, D .
ADVANCES IN ELECTRONINCS AND ELECTRON PHYSICS, 1983, 61 :161-298
[19]   FUNDAMENTALS OF AUGER-ELECTRON SPECTROSCOPY [J].
LEVENSON, LL .
SCANNING ELECTRON MICROSCOPY, 1983, :1643-1653
[20]   AUGER-ELECTRON SPECTROSCOPY TECHNIQUE FOR NITROGEN DEPTH PROFILING IN TITANIUM COMPOUNDS [J].
PANTEL, R ;
LEVY, D ;
NICOLAS, D .
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A-VACUUM SURFACES AND FILMS, 1988, 6 (05) :2953-2956
12345