SCANNING ELECTROCHEMICAL AND TUNNELING ULTRAMICROELECTRODE MICROSCOPE FOR HIGH-RESOLUTION EXAMINATION OF ELECTRODE SURFACES IN SOLUTION

被引：223

作者：

LIU, HY ^{[1
]}

FAN, FRF ^{[1
]}

LIN, CW ^{[1
]}

BARD, AJ ^{[1
]}

机构：

[1] UNIV TEXAS,DEPT CHEM,AUSTIN,TX 78712

来源：

JOURNAL OF THE AMERICAN CHEMICAL SOCIETY | 1986年 / 108卷 / 13期

关键词：

D O I：

10.1021/ja00273a054

中图分类号：

O6 [化学];

学科分类号：

0703 ;

摘要：

引用

页码：3838 / 3839

页数：2

共 11 条

[1] DETERMINATION OF SURFACE-TOPOGRAPHY OF BIOLOGICAL SPECIMENS AT HIGH-RESOLUTION BY SCANNING TUNNELLING MICROSCOPY [J].

BARO, AM ;

MIRANDA, R ;

ALAMAN, J ;

GARCIA, N ;

BINNIG, G ;

ROHRER, H ;

GERBER, C ;

CARRASCOSA, JL .

NATURE, 1985, 315 (6016) :253-254

[2] TUNNELING THROUGH A CONTROLLABLE VACUUM GAP [J].

BINNIG, G ;

ROHRER, H ;

GERBER, C ;

WEIBEL, E .

APPLIED PHYSICS LETTERS, 1982, 40 (02) :178-180

[3]

BINNIG G, 1985, SURF SCI, V17, P152

[4] LOW-TEMPERATURE VACUUM TUNNELING MICROSCOPY [J].

ELROD, SA ;

DELOZANNE, AL ;

QUATE, CF .

APPLIED PHYSICS LETTERS, 1984, 45 (11) :1240-1242

[5] DISTRIBUTION OF ELECTROCHEMICAL ACTIVITY ON GRAPHITE EPOXY SURFACES [J].

ENGSTROM, RC ;

WEBER, M ;

WERTH, J .

ANALYTICAL CHEMISTRY, 1985, 57 (04) :933-936

[6]

ENGSTROM RW, COMMUNICATION

[7] SURFACE-MORPHOLOGY OF OXIDIZED AND ION-ETCHED SILICON BY SCANNING TUNNELING MICROSCOPY [J].

FEENSTRA, RM ;

OEHRLEIN, GS .

APPLIED PHYSICS LETTERS, 1985, 47 (02) :97-99

[8] SCANNING TUNNELING MICROSCOPE COMBINED WITH A SCANNING ELECTRON-MICROSCOPE [J].

GERBER, C ;

BINNIG, G ;

FUCHS, H ;

MARTI, O ;

ROHRER, H .

REVIEW OF SCIENTIFIC INSTRUMENTS, 1986, 57 (02) :221-224

[9] SURFACE PREPARATION AND PIT PROPAGATION IN STAINLESS-STEELS [J].

ISAACS, HS ;

KISSEL, G .

JOURNAL OF THE ELECTROCHEMICAL SOCIETY, 1972, 119 (12) :1628-&

[10]

PASHLEY MD, 1985, SURF SCI, V27, P152

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