TRANSMITTANCE RATIO OF A COMPENSATOR

被引:2
作者
KOTHIYAL, MP [1 ]
机构
[1] INDIAN INST TECHNOL,MECH ENGN DEPT,FINE TECH LAB,MADRAS 600036,INDIA
来源
APPLIED OPTICS | 1975年 / 14卷 / 12期
关键词
D O I
10.1364/AO.14.002935
中图分类号
O43 [光学];
学科分类号
070207 ; 0803 ;
摘要
引用
收藏
页码:2935 / 2939
页数:5
相关论文
共 13 条
[1]  
ASPES DE, 1971, J OPT SOC AM, V61, P1077
[2]   SPECIMEN COHERENT SCATTERING AND COMPENSATOR DEFECTS IN ELLIPSOMETRY [J].
AZZAM, RMA ;
BASHARA, NM .
JOURNAL OF THE OPTICAL SOCIETY OF AMERICA, 1971, 61 (09) :1236-&
[3]   CALIBRATION OF ELLIPSOMETER DIVIDED CIRCLES [J].
AZZAM, RMA ;
BASHARA, NM .
JOURNAL OF THE OPTICAL SOCIETY OF AMERICA, 1971, 61 (08) :1118-&
[5]  
Ghezzo M., 1969, British Journal of Applied Physics (Journal of Physics D), V2, P1483
[6]   EXACT THEORY OF RETARDATION PLATES [J].
HOLMES, DA .
JOURNAL OF THE OPTICAL SOCIETY OF AMERICA, 1964, 54 (09) :1115-+
[7]   FORMULAS FOR USING WAVE PLATES IN ELLIPSOMETRY [J].
HOLMES, DA ;
FEUCHT, DL .
JOURNAL OF THE OPTICAL SOCIETY OF AMERICA, 1967, 57 (04) :466-+
[8]   GENERAL EQUATIONS OF SYMMETRICAL ELLIPSOMETER ARRANGEMENTS [J].
JOHNSON, JA ;
BASHARA, NM .
JOURNAL OF THE OPTICAL SOCIETY OF AMERICA, 1970, 60 (02) :221-&
[9]  
KOTHIYAL MP, IN PRESS
[10]   MEASUREMEMT OF THICKNESS AND REFRACTIVE INDEX OF VERY THIN FILMS AND OPTICAL PROPERTIES OF SURFACES BY ELLIPSOMETRY [J].
MCCRACKIN, FL ;
PASSAGLIA, E ;
STROMBERG, RR ;
STEINBERG, HL .
JOURNAL OF RESEARCH OF THE NATIONAL BUREAU OF STANDARDS SECTION A-PHYSICS AND CHEMISTRY, 1963, A 67 (04) :363-+