NOISE MEASUREMENTS IN CHARGE-COUPLED-DEVICES

被引：23
作者：
MOHSEN, AM [1 ]
TOMPSETT, MF [1 ]
SEQUIN, CH [1 ]
机构：
[1] BELL TEL LABS INC,UNIPOLAR DESIGN LAB,MURRAY HILL,NJ 07974
来源：
IEEE TRANSACTIONS ON ELECTRON DEVICES | 1975年 / ED22卷 / 05期
关键词：
D O I：
10.1109/T-ED.1975.18110
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
引用
收藏
页码：209 / 218
页数：10
相关论文
共 23 条
[11]   INFLUENCE OF INTERFACE STATES ON INCOMPLETE CHARGE-TRANSFER IN OVERLAPPING GATE CHARGE-COUPLED DEVICES [J].
MOHSEN, AM ;
MCGILL, TC ;
DAIMON, Y ;
MEAD, CA .
IEEE JOURNAL OF SOLID-STATE CIRCUITS, 1973, SC 8 (02) :125-138
[12]  
MOHSEN AM, TO BE PUBLISHED
[13]   LINEARITY OF ELECTRICAL CHARGE INJECTION INTO CHARGE-COUPLED-DEVICES [J].
SEQUIN, CH ;
MOHSEN, AM .
IEEE JOURNAL OF SOLID-STATE CIRCUITS, 1975, SC10 (02) :81-92
[14]   NOISE SUPPRESSION IN CHARGE-TRANSFER DEVICES [J].
THORNBER, KK .
PROCEEDINGS OF THE INSTITUTE OF ELECTRICAL AND ELECTRONICS ENGINEERS, 1972, 60 (09) :1113-&
[15]   ERROR RATES OF DIGITAL SIGNALS IN CHARGE-TRANSFER DEVICES [J].
THORNBER, KK .
BELL SYSTEM TECHNICAL JOURNAL, 1973, 52 (10) :1795-1809
[16]   SPECTRAL DENSITY OF NOISE GENERATED IN CHARGE-TRANSFER DEVICES [J].
THORNBER, KK ;
TOMPSETT, MF .
IEEE TRANSACTIONS ON ELECTRON DEVICES, 1973, ED20 (04) :456-456
[17]  
THORNBER KK, 1974, BELL SYST TECH J, V53
[18]   QUANTITATIVE EFFECTS OF INTERFACE STATES ON PERFORMANCE OF CHARGE-COUPLED DEVICES [J].
TOMPSETT, MF .
IEEE TRANSACTIONS ON ELECTRON DEVICES, 1973, ED20 (01) :45-55
[19]   USE OF CHARGE-COUPLED DEVICES FOR DELAYING ANALOG SIGNALS [J].
TOMPSETT, MF ;
ZIMANY, EJ .
IEEE JOURNAL OF SOLID-STATE CIRCUITS, 1973, SC 8 (02) :151-157
[20]  
TOMPSETT MF, TO BE PUBLISHED
123