NOISE MEASUREMENTS IN CHARGE-COUPLED-DEVICES

被引：23

作者：

MOHSEN, AM ^{[1
]}

TOMPSETT, MF ^{[1
]}

SEQUIN, CH ^{[1
]}

机构：

[1] BELL TEL LABS INC,UNIPOLAR DESIGN LAB,MURRAY HILL,NJ 07974

来源：

IEEE TRANSACTIONS ON ELECTRON DEVICES | 1975年 / ED22卷 / 05期

关键词：

D O I：

10.1109/T-ED.1975.18110

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

引用

页码：209 / 218

页数：10

共 23 条

[1] 3-LEVEL METALLIZATION 3-PHASE CCD [J].

BERTRAM, WJ ;

MOHSEN, AM ;

MORRIS, FJ ;

SEALER, DA ;

SEQUIN, CH ;

TOMPSETT, MF .

IEEE TRANSACTIONS ON ELECTRON DEVICES, 1974, ED21 (12) :758-767

[2]

BOONSTRA L, 1972, 1972 IEEE INT SOL ST, P140

[3] CHARGE COUPLED SEMICONDUCTOR DEVICES [J].

BOYLE, WS ;

SMITH, GE .

BELL SYSTEM TECHNICAL JOURNAL, 1970, 49 (04) :587-+

[4]

CARNES JE, 1972, RCA REV, V33, P327

[5]

CARNES JE, 1973, RCA REV, V34, P553

[6]

EMMONS SP, 1973, JUN DEV RES C BOULD

[7]

EMMONS SP, TO BE PUBLISHED

[8]

KIM CK, 1972, C P NEREM, P161

[9]

Mohsen A. M., 1974, IEEE Transactions on Electron Devices, VED-21, P701, DOI 10.1109/T-ED.1974.17997

[10] PUSH CLOCKS - NEW APPROACH TO CHARGE-COUPLED DEVICES CLOCKING [J].

MOHSEN, AM ;

MCGILL, TC ;

ANTHONY, M ;

MEAD, CA .

APPLIED PHYSICS LETTERS, 1973, 22 (04) :172-175

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