ARSENIC OVERLAYER ON SI(111) - REMOVAL OF SURFACE RECONSTRUCTION

被引:128
作者
OLMSTEAD, MA [1 ]
BRINGANS, RD [1 ]
UHRBERG, RIG [1 ]
BACHRACH, RZ [1 ]
机构
[1] XEROX CORP,PALO ALTO RES CTR,PALO ALTO,CA 94304
来源
PHYSICAL REVIEW B | 1986年 / 34卷 / 08期
关键词
D O I
10.1103/PhysRevB.34.6041
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
引用
收藏
页码:6041 / 6044
页数:4
相关论文
共 12 条
[1]   ARSENIC-TERMINATED GE(111) - AN IDEAL 1 X 1 SURFACE [J].
BRINGANS, RD ;
UHRBERG, RIG ;
BACHRACH, RZ ;
NORTHRUP, JE .
PHYSICAL REVIEW LETTERS, 1985, 55 (05) :533-536
[2]   7X7 RECONSTRUCTION OF GE(111) SURFACES UNDER COMPRESSIVE STRAIN [J].
GOSSMANN, HJ ;
BEAN, JC ;
FELDMAN, LC ;
MCRAE, EG ;
ROBINSON, IK .
PHYSICAL REVIEW LETTERS, 1985, 55 (10) :1106-1109
[3]   REORDERING OF RECONSTRUCTED SI-SURFACES UPON GE-DEPOSITION AT ROOM-TEMPERATURE [J].
GOSSMANN, HJ ;
FELDMAN, LC ;
GIBSON, WM .
PHYSICAL REVIEW LETTERS, 1984, 53 (03) :294-297
[4]   ELECTRONIC-STRUCTURE OF SI(111) SURFACES [J].
HIMPSEL, FJ ;
FAUSTER, T ;
HOLLINGER, G .
SURFACE SCIENCE, 1983, 132 (1-3) :22-30
[5]   SURFACE-STATES ON SI(111)-(2X1) [J].
HIMPSEL, FJ ;
HEIMANN, P ;
EASTMAN, DE .
PHYSICAL REVIEW B, 1981, 24 (04) :2003-2008
[6]   NEW PI-BONDED CHAIN MODEL FOR SI(111)-(2BY1) SURFACE [J].
PANDEY, KC .
PHYSICAL REVIEW LETTERS, 1981, 47 (26) :1913-1917
[7]   TOTAL-ENERGY CALCULATIONS ON THE TAKAYANAGI MODEL FOR THE SI(111)7X7 SURFACE [J].
QIAN, GX ;
CHADI, DJ .
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, 1986, 4 (04) :1079-1082
[8]   CHLORINE CHEMISORPTION ON SILICON AND GERMANIUM SURFACES - PHOTOEMISSION POLARIZATION EFFECTS WITH SYNCHROTRON RADIATION [J].
ROWE, JE ;
MARGARITONDO, G ;
CHRISTMAN, SB .
PHYSICAL REVIEW B, 1977, 16 (04) :1581-1589
[9]   CHEMISORPTION OF ATOMIC-HYDROGEN ON SILICON (111)7X7 SURFACE [J].
SAKURAI, T ;
HAGSTRUM, HD .
PHYSICAL REVIEW B, 1975, 12 (12) :5349-5354
[10]   STRUCTURAL-ANALYSIS OF SI(111)-7X7 BY UHV-TRANSMISSION ELECTRON-DIFFRACTION AND MICROSCOPY [J].
TAKAYANAGI, K ;
TANISHIRO, Y ;
TAKAHASHI, M ;
TAKAHASHI, S .
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A-VACUUM SURFACES AND FILMS, 1985, 3 (03) :1502-1506