COMPOSITION DEPENDENCE OF EQUAL THICKNESS FRINGES IN AN ELECTRON-MICROSCOPE IMAGE OF GAAS/ALXGA1-XAS MULTILAYER STRUCTURE

被引：86
作者：
KAKIBAYASHI, H
NAGATA, F
机构：
[1] Hitachi Ltd, Kokubunji, Jpn, Hitachi Ltd, Kokubunji, Jpn
来源：
JAPANESE JOURNAL OF APPLIED PHYSICS PART 2-LETTERS | 1985年 / 24卷 / 12期
关键词：
D O I：
10.1143/JJAP.24.L905
中图分类号：
O59 [应用物理学];
学科分类号：
摘要：
6
引用
收藏
页码：L905 / L907
页数：3
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